Nvidia corporation (20240353238). WEAK MEASUREMENT BASED SYSTEMS AND DEVICES FOR QUANTUM METROLOGY simplified abstract
Contents
WEAK MEASUREMENT BASED SYSTEMS AND DEVICES FOR QUANTUM METROLOGY
Organization Name
Inventor(s)
Hossein Seifoory of Toronto (CA)
Elad Mentovich of Tel Aviv (IL)
Juan Jose Vegas Olmos of Solroed Strand (DK)
WEAK MEASUREMENT BASED SYSTEMS AND DEVICES FOR QUANTUM METROLOGY - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240353238 titled 'WEAK MEASUREMENT BASED SYSTEMS AND DEVICES FOR QUANTUM METROLOGY
- Simplified Explanation:**
The patent application describes systems and methods used in quantum metrology, including a quantum device with a weak measurement module that prevents wave function collapse and a data processing unit for improved time synchronization and networking features.
- Key Features and Innovation:**
- Quantum device with weak measurement module
- Prevents wave function collapse
- Data processing unit for improved time synchronization and networking features
- Potential Applications:**
This technology can be applied in quantum metrology, precision measurement, quantum computing, and quantum communication systems.
- Problems Solved:**
The technology addresses the challenge of preventing wave function collapse in quantum systems and enhances time synchronization and networking capabilities.
- Benefits:**
- Improved accuracy in quantum measurements
- Enhanced time synchronization in quantum systems
- Better networking features for quantum devices
- Commercial Applications:**
Potential commercial applications include quantum metrology devices, precision measurement tools, quantum communication systems, and quantum computing platforms.
- Prior Art:**
Researchers can explore prior art related to weak measurements in quantum systems, quantum metrology techniques, and data processing in quantum devices.
- Frequently Updated Research:**
Stay updated on the latest advancements in quantum metrology, weak measurements in quantum systems, and data processing techniques for quantum devices.
- Questions about Quantum Metrology:**
1. What are the key challenges in quantum metrology that this technology addresses? 2. How does the weak measurement module prevent wave function collapse in quantum systems?
Original Abstract Submitted
systems, devices, and methods are described herein that are employed in quantum metrology. an example quantum device includes a weak measurement module operably coupled with a quantum system. the weak measurement module is configured to apply one or more measurements to the quantum system and obtain information associated with the quantum system based on the one or more measurements. a strength of the one or more measurements by the weak measurement module is configured to prevent a wave function collapse associated with the quantum system. the quantum device further includes a data processing unit (dpu) operably coupled with the weak measurement module that performs one or more operations on the obtained information associated with the quantum system and provides improved time synchronization and networking features.
