18713248. METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER simplified abstract (HITACHI HIGH-TECH CORPORATION)

METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

Organization Name

HITACHI HIGH-TECH CORPORATION

Inventor(s)

Tsugunao Toma of Tokyo (JP)

Riku Tamura of Tokyo (JP)

Hiroyuki Yasuda of Tokyo (JP)

Masuyuki Sugiyama of Tokyo (JP)

Yuichiro Hashimoto of Tokyo (JP)

METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER - A simplified explanation of the abstract

This abstract first appeared for US patent application 18713248 titled 'METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

Simplified Explanation

The method described in the patent application aims to control a mass analyzer by preventing sensitivity reduction in high ion concentration regions without changing the dwell time for each data point. The method adjusts the time length for collecting data based on the degree of space charge generated in a prefilter or the sensitivity reduction of the mass analyzer caused by the space charge.

• The method controls a mass analyzer to prevent sensitivity reduction in high ion concentration regions.
• Data collection starts at the same time interval, with varying time lengths based on the degree of space charge or sensitivity reduction.
• Adjustments are made to the data collection process to maintain sensitivity in the mass analyzer.

Key Features and Innovation

• Prevents sensitivity reduction in high ion concentration regions.
• Adjusts data collection time length based on space charge or sensitivity reduction.
• Maintains sensitivity of the mass analyzer without changing dwell time for each data point.

Potential Applications

The technology can be applied in various fields such as:

• Mass spectrometry
• Analytical chemistry
• Pharmaceutical research

Problems Solved

• Prevents sensitivity reduction in high ion concentration regions.
• Maintains accuracy of mass analysis.
• Improves data collection efficiency.

Benefits

• Enhanced sensitivity in mass analysis.
• Consistent data quality.
• Efficient data collection process.

Commercial Applications

Title: Advanced Mass Analyzer Control Technology for Improved Data Collection This technology can be utilized in:

• Research laboratories
• Pharmaceutical companies
• Environmental testing facilities

Prior Art

Readers interested in prior art related to this technology can explore research papers and patents in the field of mass spectrometry and analytical chemistry.

Frequently Updated Research

Stay updated on the latest advancements in mass analyzer control technology by following research publications and conferences in the field of analytical instrumentation.

Questions about Mass Analyzer Control Technology

1. What are the potential drawbacks of adjusting data collection time length based on space charge or sensitivity reduction?

  - Adjusting data collection time length may introduce variability in the data, impacting the accuracy of mass analysis results.

2. How does this technology compare to existing methods for controlling mass analyzers?

  - This technology offers a unique approach to maintaining sensitivity in high ion concentration regions without altering dwell times, setting it apart from traditional control methods.

Original Abstract Submitted

An object of the present disclosure is to provide a method for controlling a mass analyzer. According to the method, sensitivity reduction in a high ion concentration region can be prevented without changing a dwell time for each data point. In the method for controlling a mass analyzer according to the present disclosure, starting collecting data is executed at the same time interval, and a time length for collecting the data varies depending on a degree of space charge generated in a prefilter or a degree of sensitivity reduction of the mass analyzer caused by the space charge.