18131271. APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM simplified abstract (Applied Materials, Inc.)
Contents
APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM
Organization Name
Inventor(s)
Alexandre Likhanskii of Malden MA (US)
Nirbhav Singh Chopra of Princeton NJ (US)
Peter F. Kurunczi of Cambridge MA (US)
Anthony Renau of West Newbury MA (US)
Joseph C. Olson of Beverly MA (US)
Frank Sinclair of Hartland ME (US)
APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18131271 titled 'APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM
The abstract describes an apparatus that includes an Electrodynamic Mass Analysis (EDMA) assembly positioned downstream from a convergent ion beam assembly. The EDMA assembly consists of a first stage with upper and lower electrodes, and a second stage with upper and lower electrodes as well. Additionally, there is a deflection assembly between the first and second stages, which includes a blocker, upper deflection electrode, and lower deflection electrode.
- The apparatus includes an Electrodynamic Mass Analysis (EDMA) assembly with multiple stages and electrodes.
- A deflection assembly is positioned between the stages to guide the ion beam.
- The blocker, upper deflection electrode, and lower deflection electrode help in the analysis process.
- The apparatus is designed to efficiently analyze masses of ions in a precise manner.
- The configuration of the electrodes and stages allows for accurate mass analysis of ions.
Potential Applications: - Mass spectrometry - Analytical chemistry - Environmental monitoring
Problems Solved: - Accurate mass analysis of ions - Efficient ion beam guidance - Precise measurement of ion masses
Benefits: - Improved accuracy in mass analysis - Enhanced efficiency in ion beam analysis - Greater precision in measuring ion masses
Commercial Applications: Title: Advanced Mass Analysis Apparatus for Scientific Research and Industrial Applications This technology can be used in laboratories, research facilities, and industrial settings for mass analysis of ions, contributing to advancements in various fields such as pharmaceuticals, environmental science, and material research.
Prior Art: Readers can explore prior research on mass spectrometry, ion beam analysis, and electrodynamic mass analysis techniques to gain a deeper understanding of the technology's evolution.
Frequently Updated Research: Stay updated on the latest developments in mass spectrometry, ion analysis techniques, and advancements in analytical chemistry for potential insights into the future of mass analysis technologies.
Questions about Electrodynamic Mass Analysis: 1. How does the deflection assembly contribute to the accuracy of mass analysis? The deflection assembly guides the ion beam through the stages, ensuring precise measurement of ion masses by controlling their trajectory.
2. What are the key differences between the first and second stages of the EDMA assembly? The first stage includes upper and lower electrodes, while the second stage also has upper and lower electrodes but is positioned downstream from the first stage for further analysis.
Original Abstract Submitted
An apparatus may include an electrodynamic mass analysis (EDMA) assembly disposed downstream from the convergent ion beam assembly. The EDMA assembly may include a first stage, comprising a first upper electrode, disposed above a beam axis, and a first lower electrode, disposed below the beam axis, opposite the first upper electrode. The EDMA assembly may also include a second stage, disposed downstream of the first stage and comprising a second upper electrode, disposed above the beam axis, and a second lower electrode, disposed below the beam axis. The EDMA assembly may further include a deflection assembly, disposed between the first stage and the second stage, the deflection assembly comprising a blocker, disposed along the beam axis, an upper deflection electrode, disposed on a first side of the blocker, and a lower deflection electrode, disposed on a second side of the blocker.
