Panasonic intellectual property management co., ltd. (20240345221). MEASUREMENT DEVICE simplified abstract
Contents
MEASUREMENT DEVICE
Organization Name
panasonic intellectual property management co., ltd.
Inventor(s)
MEASUREMENT DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240345221 titled 'MEASUREMENT DEVICE
The patent application describes a measurement device that utilizes an interference optical system to generate interference light for detection.
- The device includes a light source, an interference optical system, an optical element, and a photodetector.
- The interference optical system separates light into reference light and irradiation light, causing them to interfere and generate interference light.
- The optical element emits the irradiation light and receives the reflected light.
- The photodetector detects the interference light.
- The interference optical system includes a beam splitter to facilitate the separation of light.
- The device satisfies specific optical path length conditions to ensure accurate measurement.
Potential Applications:
- Precision measurement in scientific research
- Industrial quality control processes
- Medical imaging and diagnostics
Problems Solved:
- Ensures accurate and reliable measurement results
- Facilitates interference-based detection in various applications
Benefits:
- Improved accuracy in measurements
- Enhanced reliability in interference-based systems
- Versatile applications in different fields
Commercial Applications:
- Optical metrology equipment for industrial use
- Medical imaging devices for healthcare facilities
- Research instruments for scientific laboratories
Questions about the technology: 1. How does the interference optical system contribute to the accuracy of measurements? 2. What are the potential limitations of this measurement device in practical applications?
Frequently Updated Research: Ongoing research focuses on optimizing the interference optical system for enhanced performance and expanding the device's applications in diverse fields.
Original Abstract Submitted
a measurement device includes: a light source; an interference optical system that separates light into reference light and irradiation light and causes reflected light and the reference light to interfere with each other to generate interference light; an optical element that emits the irradiation light and receives the reflected light; and a photodetector that detects the interference light. the interference optical system includes a beam splitter. the measurement device satisfies d1≤d2+d3 and d2+d3−d1|≥|d4−d1| where d1 is an optical path length from the beam splitter to the photodetector, d2 is an optical path length from the beam splitter to the optical element, d3 is an optical path length from the optical element to the photodetector, and d4 is an optical path length from the beam splitter to the photodetector via a noise light path inside the interference optical system.
