Taiwan semiconductor manufacturing company, ltd. (20240338510). TEST PATTERN GENERATION SYSTEMS AND METHODS simplified abstract
Contents
TEST PATTERN GENERATION SYSTEMS AND METHODS
Organization Name
taiwan semiconductor manufacturing company, ltd.
Inventor(s)
Hsu-Ting Huang of Hsinchu (TW)
TEST PATTERN GENERATION SYSTEMS AND METHODS - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240338510 titled 'TEST PATTERN GENERATION SYSTEMS AND METHODS
Simplified Explanation: The patent application describes systems and methods for generating test patterns using machine learning to ensure they adhere to design rules in semiconductor manufacturing processes.
- Test pattern generation system utilizes machine learning to create test patterns that comply with design rule checks.
- Test pattern generation circuitry receives a noise image and generates a pattern image and test pattern based on it.
- The test pattern represents geometric shapes of electronic device designs without design rule violations.
Key Features and Innovation:
- Utilization of machine learning for generating test patterns.
- Compliance with design rule checks in semiconductor manufacturing processes.
- Creation of test patterns based on noise images to ensure adherence to design rules.
Potential Applications: The technology can be applied in semiconductor manufacturing processes to generate test patterns that comply with design rules, ensuring the quality and functionality of electronic devices.
Problems Solved: The technology addresses the challenge of generating test patterns that conform to design rule checks in semiconductor manufacturing processes, reducing errors and improving the efficiency of the manufacturing process.
Benefits:
- Improved accuracy and reliability of test patterns.
- Enhanced quality control in semiconductor manufacturing.
- Increased efficiency in the design and testing of electronic devices.
Commercial Applications: Potential commercial applications include semiconductor manufacturing companies, electronic device manufacturers, and companies involved in quality control and testing processes in the electronics industry.
Prior Art: Researchers can explore prior art related to machine learning in semiconductor manufacturing processes and test pattern generation to understand the existing technologies and advancements in the field.
Frequently Updated Research: Researchers may find updated studies on machine learning applications in semiconductor manufacturing and test pattern generation to stay informed about the latest developments and innovations in the industry.
Questions about Test Pattern Generation: 1. How does machine learning improve the generation of test patterns in semiconductor manufacturing processes? 2. What are the key benefits of using machine learning for test pattern generation in the electronics industry?
Original Abstract Submitted
systems and methods are provided for generating test patterns. in various embodiments, systems and methods are provided in which machine learning is utilized to generate the test patterns in a manner so that the test patterns conform with design rule check (drc) specified for a particular semiconductor manufacturing process or for particular types of devices. a test pattern generation system includes test pattern generation circuitry which receives a noise image. the test pattern generation generates a pattern image based on the noise image, and further generates a test pattern based on the pattern image. the test pattern is representative of geometric shapes of an electronic device design layout that is free of design rule check violations.
