Origin Quantum Computing Technology (Hefei) Co., Ltd (20240329162). PROBE APPARATUS, AND MEASUREMENT METHOD AND MEASUREMENT SYSTEM OF JUNCTION RESISTANCE OF SUPERCONDUCTING QUBIT simplified abstract
PROBE APPARATUS, AND MEASUREMENT METHOD AND MEASUREMENT SYSTEM OF JUNCTION RESISTANCE OF SUPERCONDUCTING QUBIT
Organization Name
Origin Quantum Computing Technology (Hefei) Co., Ltd
Inventor(s)
PROBE APPARATUS, AND MEASUREMENT METHOD AND MEASUREMENT SYSTEM OF JUNCTION RESISTANCE OF SUPERCONDUCTING QUBIT - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240329162 titled 'PROBE APPARATUS, AND MEASUREMENT METHOD AND MEASUREMENT SYSTEM OF JUNCTION RESISTANCE OF SUPERCONDUCTING QUBIT
Simplified Explanation: The patent application describes a probe apparatus, measurement method, and system for measuring the junction resistance of a superconducting qubit. The apparatus includes probes that can break down oxide layers to form conductive connections with the qubit's electrodes.
- Two independent probes in the probe set
- Probe control mechanism connects probes to oxide layers on qubit electrodes
- Power supply module applies electrical breakdown signal to probes
- Breaks down oxide layer to form conductive connection with qubit electrode
- Measures junction resistance of superconducting qubit
Potential Applications: 1. Quantum computing research 2. Superconducting qubit development 3. Nanotechnology advancements
Problems Solved: 1. Difficulty in measuring junction resistance of superconducting qubits 2. Limited control over oxide layers on qubit electrodes
Benefits: 1. Accurate measurement of junction resistance 2. Enhanced control over qubit electrodes 3. Improved understanding of superconducting qubit behavior
Commercial Applications: Quantum computing hardware development for research institutions and technology companies.
Prior Art: Researchers may look into patents related to superconducting qubit measurement techniques and probe apparatus designs.
Frequently Updated Research: Ongoing studies on superconducting qubit technologies and quantum computing applications.
Questions about Superconducting Qubit Measurement: 1. How does the probe apparatus improve the accuracy of measuring junction resistance? 2. What are the implications of enhanced control over oxide layers in superconducting qubit research?
Original Abstract Submitted
disclosed are a probe apparatus, and a measurement method and a measurement system of a junction resistance of a superconducting qubit. the probe apparatus is configured to measure a superconducting quantum chip, and includes a probe set, a probe control mechanism, and a power supply module; the probe set includes two probes that are independent; the probe control mechanism is configured to control the probe set to be connected to an oxide layer on a surface of an electrode of a josephson junction on the superconducting quantum chip; and the power supply module is configured to apply an electrical breakdown signal to two probes, to break down the oxide layer, so that the probe set forms a conductive connection with the electrode of the josephson junction.
