SEIKO EPSON CORPORATION (20240333855). ELECTRONIC DEVICE, METHOD FOR CONTROLLING ELECTRONIC DEVICE, AND IMAGE FORMING APPARATUS simplified abstract
Contents
ELECTRONIC DEVICE, METHOD FOR CONTROLLING ELECTRONIC DEVICE, AND IMAGE FORMING APPARATUS
Organization Name
Inventor(s)
Yo Kawano of MATSUMOTO-SHI (JP)
ELECTRONIC DEVICE, METHOD FOR CONTROLLING ELECTRONIC DEVICE, AND IMAGE FORMING APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240333855 titled 'ELECTRONIC DEVICE, METHOD FOR CONTROLLING ELECTRONIC DEVICE, AND IMAGE FORMING APPARATUS
The patent application describes a multifunction peripheral that can detect failures in multiple driven units and extract potential causes for these failures based on audio collection data and operation history.
- Failure detection unit identifies failures in multiple driven units.
- Candidate extraction unit collates audio collection data and extracts potential causes for failures.
- First candidate for failure component is specified based on operation history and correspondence data.
- Second candidate for failure component is extracted from the driven state immediately before the failure occurs.
- Candidate for the failure component is set based on the first and second candidates extracted.
Potential Applications: - Industrial machinery maintenance - Automotive diagnostics - Consumer electronics troubleshooting
Problems Solved: - Efficient failure detection in complex systems - Accurate identification of failure causes - Improved maintenance processes
Benefits: - Minimized downtime - Cost-effective maintenance - Enhanced system reliability
Commercial Applications: Title: "Advanced Failure Detection System for Industrial Machinery" This technology can be used in various industries such as manufacturing, automotive, and electronics to streamline maintenance processes and improve overall system reliability.
Questions about the technology: 1. How does the multifunction peripheral detect failures in driven units? - The failure detection unit is configured to identify failures in multiple driven units. 2. What data is used to extract potential causes for failures in the system? - The candidate extraction unit collates audio collection data and operation history to extract potential causes for failures.
Original Abstract Submitted
a multifunction peripheral includes: a failure detection unit configured to detect a failure that occurs in a plurality of driven units; and a candidate extraction unit configured to collate, when the failure is detected, audio collection data collected by an audio collection unit with failure audio data and extract a first candidate for a component that causes the failure, to specify a component in a driven state immediately before the failure occurs based on operation history and correspondence data and extract the specified component as a second candidate for the component that causes the failure, and to set a candidate for the component that causes the failure based on the component extracted as the first candidate and the component extracted as the second candidate.