Samsung electronics co., ltd. (20240330133). METHOD AND SYSTEM FOR REPAIRING A DYNAMIC RANDOM ACCESS MEMORY (DRAM) OF MEMORY DEVICE simplified abstract

METHOD AND SYSTEM FOR REPAIRING A DYNAMIC RANDOM ACCESS MEMORY (DRAM) OF MEMORY DEVICE

Organization Name

samsung electronics co., ltd.

Inventor(s)

Nidhi Shukla of Bengaluru (IN)

Preeti Joseph of Bengaluru (IN)

Hyunbum Cho of Bengaluru (IN)

Yongjae Shin of Bengaluru (IN)

METHOD AND SYSTEM FOR REPAIRING A DYNAMIC RANDOM ACCESS MEMORY (DRAM) OF MEMORY DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240330133 titled 'METHOD AND SYSTEM FOR REPAIRING A DYNAMIC RANDOM ACCESS MEMORY (DRAM) OF MEMORY DEVICE

The abstract describes a method, device, and system for repairing a dynamic random access memory (DRAM) memory device by reserving memory space, identifying faulty rows, updating error information, mapping faulty rows to spare rows, storing mappings in a repair table, and copying data.

• Method, device, and system for repairing DRAM memory devices
• Reserving memory space with spare rows
• Identifying faulty rows using memory testing methods
• Updating error information table for correctable faulty rows
• Mapping faulty rows to available spare rows
• Storing mappings in a repair translation table
• Copying data from faulty rows to spare rows

1. 1. 1. Potential Applications

This technology can be applied in the manufacturing and maintenance of DRAM memory devices in various electronic devices such as computers, smartphones, and servers.

1. 1. 1. Problems Solved

This technology addresses the issue of faulty rows in DRAM memory devices, allowing for efficient repair and maintenance without the need for complete replacement.

1. 1. 1. Benefits

- Cost-effective repair of DRAM memory devices - Improved reliability and performance of electronic devices - Extended lifespan of DRAM memory devices

1. 1. 1. Commercial Applications

The technology can be utilized by semiconductor manufacturers, electronics companies, and IT departments for repairing and maintaining DRAM memory devices, leading to cost savings and improved device performance.

1. 1. 1. Prior Art

Readers can explore prior research on DRAM memory device repair methods, memory testing techniques, and error correction mechanisms in semiconductor devices.

1. 1. 1. Frequently Updated Research

Stay informed about advancements in DRAM memory device repair techniques, memory testing technologies, and error correction algorithms to enhance the efficiency and effectiveness of this technology.

1. 1. 1. 1. Questions about DRAM Memory Device Repair

1. How does this technology impact the overall reliability of electronic devices? 2. What are the potential cost savings associated with using this repair method for DRAM memory devices?

Original Abstract Submitted

various example embodiments are directed to a method, device, and system for repairing a dynamic random access memory (dram) memory device. the method includes reserving a memory space within the dram memory device, the reserved memory space including a plurality of spare rows, identifying one or more faulty rows within the dram memory device using at least one memory testing method, updating an error information table based on information of a respective classified correctable faulty row, in response to an error count for the respective classified correctable faulty row exceeding a desired threshold value, mapping the respective classified correctable faulty row to an available spare row of the plurality of spare rows, storing the mapping of the respective correctable faulty row and the mapped spare row in a row repair translation table, and copying data stored in the respective correctable faulty row into the mapped spare row.