18122908. Memory system, memory access interface device and operation method thereof simplified abstract (REALTEK SEMICONDUCTOR CORP.)
Contents
Memory system, memory access interface device and operation method thereof
Organization Name
Inventor(s)
CHIH-WEI Chang of Hsinchu (TW)
Memory system, memory access interface device and operation method thereof - A simplified explanation of the abstract
This abstract first appeared for US patent application 18122908 titled 'Memory system, memory access interface device and operation method thereof
The present disclosure reveals a memory access interface device that includes a signal training circuit for transmitting training data signals to a memory device and receiving read data signals from it. The device compares the training data signal with the read data signal to determine if they match, storing the result for further analysis. The clock generation circuit is controlled to modify the timing of the training data signals, allowing for the execution of a new loop of a training process.
- Signal training circuit for transmitting training data signals to a memory device and receiving read data signals
- Comparison of training data signals with read data signals to determine a match
- Clock generation circuit controlled to modify timing for executing a new loop of a training process
Potential Applications: - This technology can be used in memory testing equipment for quality control purposes. - It can also be applied in data storage devices to ensure data integrity and reliability.
Problems Solved: - Ensures accurate data transmission and reception in memory devices. - Facilitates efficient testing and calibration of memory access interfaces.
Benefits: - Improved data accuracy and reliability in memory devices. - Enhanced performance and efficiency in memory testing processes.
Commercial Applications: Title: Memory Access Interface Device for Enhanced Data Accuracy This technology can be utilized in the semiconductor industry for testing memory devices and ensuring high-quality data storage solutions. It can also be integrated into data centers and server systems to optimize data processing and storage capabilities.
Questions about Memory Access Interface Device: 1. How does the signal training circuit improve data accuracy in memory devices? The signal training circuit transmits training data signals and compares them with read data signals to ensure accurate data transmission and reception in memory devices.
2. What are the potential applications of this technology beyond memory testing equipment? This technology can also be applied in data storage devices to enhance data integrity and reliability.
Original Abstract Submitted
The present disclosure discloses a memory access interface device. A signal training circuit is configured for performing following steps. A transmitting circuit transmits a training data signal and a training data strobe signal as an output data signal and an output data strobe signal to a memory device according to timing reference signals. A read data signal from the memory device is received. The training data signal and the read data signal are compared to generate a comparison result indicating whether the read data signal matches the training data signal. The comparison result is stored. The clock generation circuit is controlled to modify a phase of one of the timing reference signals, further modifying the timing of one of the training data signal and the training data strobe signal, to be one of under-test phases to execute a new loop of a training process.
