PARTICLE BEAM MICROSCOPE

Organization Name

Inventor(s)

PARTICLE BEAM MICROSCOPE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18600289 titled 'PARTICLE BEAM MICROSCOPE

Simplified Explanation:

The patent application describes a particle beam microscope that utilizes two scintillators to generate light with different spectral distributions, which overlap to enhance imaging capabilities.

The particle beam microscope includes a particle beam source, an objective lens, a first scintillator, a second scintillator, and a light detector.
The first scintillator generates light with a first spectral distribution, while the second scintillator generates light with a different second spectral distribution.
The overlapping beam paths of light from the two scintillators improve the imaging quality of the microscope.

Key Features and Innovation:

Utilization of two scintillators with different spectral distributions.
Overlapping beam paths of light for enhanced imaging capabilities.
Improved imaging quality in a particle beam microscope.

Potential Applications:

Material analysis in research laboratories.
Biological imaging in medical research.
Semiconductor inspection in manufacturing processes.

Problems Solved:

Enhanced imaging resolution.
Improved contrast in microscopic images.
Better differentiation of materials or structures.

Benefits:

Higher quality imaging results.
Increased accuracy in material analysis.
Enhanced visualization of microscopic details.

Commercial Applications:

Particle Beam Microscope Technology for Advanced Material Analysis and Biological Imaging

Questions about Particle Beam Microscope Technology:

1. How does the use of two scintillators with different spectral distributions improve imaging quality in a particle beam microscope? 2. What are the potential commercial applications of this technology in various industries?

Original Abstract Submitted

A particle beam microscope comprises a particle beam source, an objective lens, a first scintillator, a second scintillator, and a light detector. A first beam path of light generated by the first scintillator and a second beam path of light generated by the second scintillator overlap one another. A scintillator body of the first scintillator generates light having a first spectral distribution. The second scintillator generates light having a second spectral distribution, which is different from the first spectral distribution.