Canon kabushiki kaisha (20240302363). PARTICLES FOR SPECIMEN EXAMINATIONS simplified abstract

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PARTICLES FOR SPECIMEN EXAMINATIONS

Organization Name

canon kabushiki kaisha

Inventor(s)

TEIGO Sakakibara of Tokyo (JP)

NORISHIGE Kakegawa of Tokyo (JP)

IKUO Nakajima of Tokyo (JP)

FUMIO Yamauchi of Kanagawa (JP)

KENGO Kanazaki of Kanagawa (JP)

TAKAHIRO Masumura of Tochigi (JP)

TOMOHIRO Nakamura of Saitama (JP)

PARTICLES FOR SPECIMEN EXAMINATIONS - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240302363 titled 'PARTICLES FOR SPECIMEN EXAMINATIONS

Simplified Explanation: The patent application describes a particle that enhances the sensitivity of specimen testing through a fluorescence depolarization method. The particle includes a polymer with styrene and organic silane units, as well as a europium complex, and features a siloxane bond on its surface.

  • The particle enables high-sensitivity specimen testing.
  • Contains a polymer with styrene and organic silane units.
  • Includes a europium complex for fluorescence enhancement.
  • Features a siloxane bond on its surface for stability.
  • Utilizes a fluorescence depolarization method for testing.

Potential Applications: 1. Medical diagnostics for sensitive specimen testing. 2. Environmental testing for pollutants or contaminants. 3. Research applications in biochemistry and molecular biology.

Problems Solved: 1. Enhances sensitivity in specimen testing. 2. Provides stability and reliability in testing methods. 3. Enables accurate detection of target substances.

Benefits: 1. Improved accuracy and sensitivity in testing. 2. Enhanced reliability and stability of testing methods. 3. Facilitates efficient and precise detection of target substances.

Commercial Applications: The technology can be utilized in medical laboratories, environmental testing facilities, and research institutions for enhanced specimen testing and analysis, potentially leading to more accurate results and discoveries.

Questions about Particle for High-Sensitivity Specimen Testing: 1. How does the particle enhance sensitivity in specimen testing? 2. What are the potential commercial applications of this technology?

Frequently Updated Research: Ongoing research may focus on optimizing the particle composition for even higher sensitivity in specimen testing, as well as exploring new applications in various industries.


Original Abstract Submitted

provided are a particle that enables a high-sensitivity specimen test by a fluorescence depolarization method, and a method of producing the same. specifically, provided is a particle including a particle substrate, wherein the particle substrate includes: a polymer containing a styrene unit and an organic silane unit; and a europium complex, and wherein the particle substrate contains a siloxane bond on at least a surface of the particle substrate.