Jump to content

Sk hynix inc. (20240264038). PROBE CARD simplified abstract

From WikiPatents
Revision as of 05:28, 13 August 2024 by Unknown user (talk) (Creating a new page)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)

PROBE CARD

Organization Name

sk hynix inc.

Inventor(s)

Sung Wook Cho of Icheon-si (KR)

Yeon Su Yeo of Icheon-si (KR)

PROBE CARD - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240264038 titled 'PROBE CARD

Simplified Explanation: The patent application discloses probe cards that can replace lens units in certain applications. These probe cards include a lens unit, a jig for holding the lens unit, and a holder unit for supporting the lens unit.

Key Features and Innovation:

  • Probe cards with integrated lens units for light irradiation.
  • Jig for securely holding the lens unit in place.
  • Holder unit for providing support to the lens unit.

Potential Applications: The technology can be used in semiconductor testing, optical inspection systems, and other applications requiring precise light irradiation.

Problems Solved: The technology addresses the need for accurate and controlled light irradiation in various testing and inspection processes.

Benefits:

  • Improved accuracy and precision in light irradiation.
  • Simplified setup and operation in testing and inspection systems.
  • Enhanced reliability and repeatability of results.

Commercial Applications: The technology can be applied in the semiconductor industry, electronics manufacturing, and quality control processes for various industries.

Questions about Probe Cards with Integrated Lens Units: 1. How does the integration of lens units in probe cards improve testing processes? 2. What are the potential cost savings associated with using probe cards with integrated lens units?

Frequently Updated Research: Stay updated on advancements in probe card technology and applications in semiconductor testing and optical inspection systems.


Original Abstract Submitted

probe cards that can replace lens units are disclosed. in some implementations, a probe card may include a lens unit through which light irradiated from a light source unit; a jig into which the lens unit is inserted inside, and a holder unit for closely supporting the lens unit.

(Ad) Transform your business with AI in minutes, not months

Custom AI strategy tailored to your specific industry needs
Step-by-step implementation with measurable ROI
5-minute setup that requires zero technical skills
Get your AI playbook

Trusted by 1,000+ companies worldwide

Cookies help us deliver our services. By using our services, you agree to our use of cookies.