US Patent Application 18234003. SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS simplified abstract

SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS

Organization Name

TEXAS INSTRUMENTS INCORPORATED

Inventor(s)

Lee D. Whetsel of Parker TX (US)

SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18234003 titled 'SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS

Simplified Explanation

- The patent application describes a test architecture for integrated circuits. - The architecture includes a scan frame input shift register, a scan frame output shift register, a test controller, and a test interface. - The test interface consists of a scan input, a scan clock, a test enable, and a scan output. - Scan frames are used to input test stimulus data and test commands into the shift register. - The output shift register produces scan frames with test response data and potentially other output data. - The command section of the input scan frame controls the test architecture to perform the desired test operation.

• The patent application aims to improve the testing process for integrated circuits.
• It introduces a test architecture that utilizes shift registers and a test interface.
• The architecture allows for the input of test stimulus data and commands.
• It also enables the output of test response data and potentially other output data.
• The command section of the input scan frame controls the execution of desired test operations.

Original Abstract Submitted

Testing of integrated circuits is achieved by a test architecture utilizing a scan frame input shift register, a scan frame output shift register, a test controller, and a test interface comprising a scan input, a scan clock, a test enable, and a scan output. Scan frames input to the scan frame input shift register contain a test stimulus data section and a test command section. Scan frames output from the scan frame output shift register contain a test response data section and, optionally, a section for outputting other data. The command section of the input scan frame controls the test architecture to execute a desired test operation.