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- 09:01, 19 September 2024 Texas instruments incorporated (20240311313). Method and Apparatus for Dual Issue Multiply Instructions simplified abstract (hist) [3,955 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:01, 19 September 2024 Texas instruments incorporated (20240311235). HANDLING NON-CORRECTABLE ERRORS simplified abstract (hist) [4,003 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:01, 19 September 2024 Carl Zeiss Microscopy GmbH patent applications published on September 12th, 2024 (hist) [2,336 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:01, 19 September 2024 18598024. DEVICE AND METHOD FOR CONTROLLING A LIGHT SOURCE IN A MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH) (hist) [3,050 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:01, 19 September 2024 Texas instruments incorporated (20240311159). Reducing Overhead In Processor Array Searching simplified abstract (hist) [3,732 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 18600289. PARTICLE BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH) (hist) [2,886 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Texas instruments incorporated (20240310868). MANAGING CLOCK TRIGGER SIGNALS FOR ASYNCHRONOUS CLOCK DOMAINS simplified abstract (hist) [3,443 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 18600212. ELECTRON BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH) (hist) [3,758 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Texas instruments incorporated (20240310455). METHODS AND APPARATUS TO DETECT AND DIAGNOSE FAULTS IN BUCK REGULATORS simplified abstract (hist) [4,084 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Texas instruments incorporated (20240310440). DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION simplified abstract (hist) [3,549 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 18600313. PARTICLE BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH) (hist) [2,870 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Texas instruments incorporated (20240310432). CALIBRATION FOR ROUTING RESISTANCE INDUCED ERROR simplified abstract (hist) [3,470 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 18419776. MICROSCOPE WITH AT LEAST ONE OPTICAL BEAM PATH simplified abstract (Carl Zeiss Microscopy GmbH) (hist) [3,788 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Texas instruments incorporated (20240310411). METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION simplified abstract (hist) [3,529 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 18600229. PARTICLE BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH) (hist) [3,373 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 SK hynix Inc. patent applications on September 19th, 2024 (hist) [28,267 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Sk hynix inc. (20240315151). SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME simplified abstract (hist) [2,094 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 MASIMO CORPORATION patent applications published on September 12th, 2024 (hist) [2,492 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 Sk hynix inc. (20240315032). SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME simplified abstract (hist) [3,888 bytes] Wikipatents (talk | contribs) (Creating a new page)
- 09:00, 19 September 2024 18670022. ACOUSTIC SENSOR WITH ATTACHMENT PORTION simplified abstract (MASIMO CORPORATION) (hist) [3,729 bytes] Wikipatents (talk | contribs) (Creating a new page)
