Cite This Page

Jump to navigation Jump to search

Bibliographic details for Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract

Citation styles for Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract

APA style

Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract. (2024, June 28). WikiPatents, . Retrieved 17:48, October 22, 2024 from http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522.

MLA style

"Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract." WikiPatents, . 28 Jun 2024, 00:47 UTC. 22 Oct 2024, 17:48 <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522>.

MHRA style

WikiPatents contributors, 'Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract', WikiPatents, , 28 June 2024, 00:47 UTC, <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522> [accessed 22 October 2024]

Chicago style

WikiPatents contributors, "Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522 (accessed October 22, 2024).

CBE/CSE style

WikiPatents contributors. Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract [Internet]. WikiPatents, ; 2024 Jun 28, 00:47 UTC [cited 2024 Oct 22]. Available from: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522.

Bluebook style

Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract, http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522 (last visited October 22, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522",
   note = "[Online; accessed 22-October-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung electronics co., ltd. (20240211736). METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240211736)._METHOD_AND_APPARATUS_FOR_INFERRING_SEMICONDUCTOR_MEASUREMENT_RESULTS_BASED_ON_ARTIFICIAL_INTELLIGENCE_simplified_abstract&oldid=77522}",
   note = "[Online; accessed 22-October-2024]"
 }


Retrieved from "http://wikipatents.org/index.php?title=Special:CiteThisPage"