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Bibliographic details for Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract
- Page name: Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 28 June 2024 00:34 UTC
- Date retrieved: 6 September 2024 04:31 UTC
- Permanent URL: http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386
- Page Version ID: 77386
Citation styles for Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract
APA style
Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract. (2024, June 28). WikiPatents, . Retrieved 04:31, September 6, 2024 from http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386.
MLA style
"Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract." WikiPatents, . 28 Jun 2024, 00:34 UTC. 6 Sep 2024, 04:31 <http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386>.
MHRA style
WikiPatents contributors, 'Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract', WikiPatents, , 28 June 2024, 00:34 UTC, <http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386> [accessed 6 September 2024]
Chicago style
WikiPatents contributors, "Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386 (accessed September 6, 2024).
CBE/CSE style
WikiPatents contributors. Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract [Internet]. WikiPatents, ; 2024 Jun 28, 00:34 UTC [cited 2024 Sep 6]. Available from: http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386.
Bluebook style
Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract, http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386 (last visited September 6, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386", note = "[Online; accessed 6-September-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "Intel corporation (20240210470). SCAN CHAIN DIAGNOSTIC ACCURACY USING HIGH VOLUME MANUFACTURING FUNCTIONAL TESTING simplified abstract --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=Intel_corporation_(20240210470)._SCAN_CHAIN_DIAGNOSTIC_ACCURACY_USING_HIGH_VOLUME_MANUFACTURING_FUNCTIONAL_TESTING_simplified_abstract&oldid=77386}", note = "[Online; accessed 6-September-2024]" }