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Bibliographic details for Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract

Citation styles for Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract

APA style

Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract. (2024, June 20). WikiPatents, . Retrieved 01:05, June 30, 2024 from http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263.

MLA style

"Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract." WikiPatents, . 20 Jun 2024, 18:39 UTC. 30 Jun 2024, 01:05 <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263>.

MHRA style

WikiPatents contributors, 'Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract', WikiPatents, , 20 June 2024, 18:39 UTC, <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263> [accessed 30 June 2024]

Chicago style

WikiPatents contributors, "Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263 (accessed June 30, 2024).

CBE/CSE style

WikiPatents contributors. Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract [Internet]. WikiPatents, ; 2024 Jun 20, 18:39 UTC [cited 2024 Jun 30]. Available from: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263.

Bluebook style

Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract, http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263 (last visited June 30, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263",
   note = "[Online; accessed 30-June-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240203688)._APPARATUS_AND_METHOD_FOR_FABRICATING_SEMICONDUCTOR_DEVICE_BY_USING_FOCUSED_ION_BEAM_AND_SCANNING_ELECTRON_MICROSCOPE_SUPPORTED_BY_ELECTRON_DIFFRACTION_PATTERN_simplified_abstract&oldid=75263}",
   note = "[Online; accessed 30-June-2024]"
 }


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