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Bibliographic details for 18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

Citation styles for 18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

APA style

18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.). (2024, June 14). WikiPatents, . Retrieved 21:07, June 29, 2024 from http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765.

MLA style

"18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)." WikiPatents, . 14 Jun 2024, 05:21 UTC. 29 Jun 2024, 21:07 <http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765>.

MHRA style

WikiPatents contributors, '18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)', WikiPatents, , 14 June 2024, 05:21 UTC, <http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765> [accessed 29 June 2024]

Chicago style

WikiPatents contributors, "18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)," WikiPatents, , http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765 (accessed June 29, 2024).

CBE/CSE style

WikiPatents contributors. 18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) [Internet]. WikiPatents, ; 2024 Jun 14, 05:21 UTC [cited 2024 Jun 29]. Available from: http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765.

Bluebook style

18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.), http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765 (last visited June 29, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765",
   note = "[Online; accessed 29-June-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=18243835._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=72765}",
   note = "[Online; accessed 29-June-2024]"
 }


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