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Bibliographic details for Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
- Page name: Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 13 June 2024 08:36 UTC
- Date retrieved: 29 June 2024 21:00 UTC
- Permanent URL: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622
- Page Version ID: 71622
Citation styles for Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
APA style
Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract. (2024, June 13). WikiPatents, . Retrieved 21:00, June 29, 2024 from http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622.
MLA style
"Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract." WikiPatents, . 13 Jun 2024, 08:36 UTC. 29 Jun 2024, 21:00 <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622>.
MHRA style
WikiPatents contributors, 'Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract', WikiPatents, , 13 June 2024, 08:36 UTC, <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622> [accessed 29 June 2024]
Chicago style
WikiPatents contributors, "Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622 (accessed June 29, 2024).
CBE/CSE style
WikiPatents contributors. Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract [Internet]. WikiPatents, ; 2024 Jun 13, 08:36 UTC [cited 2024 Jun 29]. Available from: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622.
Bluebook style
Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract, http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622 (last visited June 29, 2024).
BibTeX entry
@misc{ wiki:xxx,
author = "WikiPatents",
title = "Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract --- WikiPatents{,} ",
year = "2024",
url = "http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622",
note = "[Online; accessed 29-June-2024]"
}
When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx,
author = "WikiPatents",
title = "Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract --- WikiPatents{,} ",
year = "2024",
url = "\url{http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622}",
note = "[Online; accessed 29-June-2024]"
}
