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Bibliographic details for Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
- Page name: Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 13 June 2024 08:36 UTC
- Date retrieved: 1 July 2024 22:13 UTC
- Permanent URL: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622
- Page Version ID: 71622
Citation styles for Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
APA style
Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract. (2024, June 13). WikiPatents, . Retrieved 22:13, July 1, 2024 from http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622.
MLA style
"Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract." WikiPatents, . 13 Jun 2024, 08:36 UTC. 1 Jul 2024, 22:13 <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622>.
MHRA style
WikiPatents contributors, 'Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract', WikiPatents, , 13 June 2024, 08:36 UTC, <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622> [accessed 1 July 2024]
Chicago style
WikiPatents contributors, "Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622 (accessed July 1, 2024).
CBE/CSE style
WikiPatents contributors. Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract [Internet]. WikiPatents, ; 2024 Jun 13, 08:36 UTC [cited 2024 Jul 1]. Available from: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622.
Bluebook style
Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract, http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622 (last visited July 1, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622", note = "[Online; accessed 1-July-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240192154)._PATTERN_INSPECTION_APPARATUS_AND_PATTERN_INSPECTION_METHOD_USING_THE_SAME_simplified_abstract&oldid=71622}", note = "[Online; accessed 1-July-2024]" }