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Bibliographic details for 18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)
- Page name: 18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 6 June 2024 01:28 UTC
- Date retrieved: 28 June 2024 02:31 UTC
- Permanent URL: http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220
- Page Version ID: 64220
Citation styles for 18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)
APA style
18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.). (2024, June 6). WikiPatents, . Retrieved 02:31, June 28, 2024 from http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220.
MLA style
"18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)." WikiPatents, . 6 Jun 2024, 01:28 UTC. 28 Jun 2024, 02:31 <http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220>.
MHRA style
WikiPatents contributors, '18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)', WikiPatents, , 6 June 2024, 01:28 UTC, <http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220> [accessed 28 June 2024]
Chicago style
WikiPatents contributors, "18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)," WikiPatents, , http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220 (accessed June 28, 2024).
CBE/CSE style
WikiPatents contributors. 18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.) [Internet]. WikiPatents, ; 2024 Jun 6, 01:28 UTC [cited 2024 Jun 28]. Available from: http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220.
Bluebook style
18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.), http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220 (last visited June 28, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220", note = "[Online; accessed 28-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=18220879._DEFECT_EVALUATION_METHOD_FOR_EVALUATING_DEFECT_DUE_TO_ELECTROSTATIC_DISCHARGE_AND_DEFECT_EVALUATION_DEVICE_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Display_Co.,_LTD.)&oldid=64220}", note = "[Online; accessed 28-June-2024]" }