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Bibliographic details for 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)

Citation styles for 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)

APA style

18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.). (2024, May 24). WikiPatents, . Retrieved 10:26, June 26, 2024 from http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538.

MLA style

"18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)." WikiPatents, . 24 May 2024, 07:44 UTC. 26 Jun 2024, 10:26 <http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538>.

MHRA style

WikiPatents contributors, '18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)', WikiPatents, , 24 May 2024, 07:44 UTC, <http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538> [accessed 26 June 2024]

Chicago style

WikiPatents contributors, "18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)," WikiPatents, , http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538 (accessed June 26, 2024).

CBE/CSE style

WikiPatents contributors. 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.) [Internet]. WikiPatents, ; 2024 May 24, 07:44 UTC [cited 2024 Jun 26]. Available from: http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538.

Bluebook style

18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.), http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538 (last visited June 26, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538",
   note = "[Online; accessed 26-June-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538}",
   note = "[Online; accessed 26-June-2024]"
 }


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