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Bibliographic details for 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)
- Page name: 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 24 May 2024 07:44 UTC
- Date retrieved: 29 June 2024 04:31 UTC
- Permanent URL: http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538
- Page Version ID: 61538
Citation styles for 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)
APA style
18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.). (2024, May 24). WikiPatents, . Retrieved 04:31, June 29, 2024 from http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538.
MLA style
"18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)." WikiPatents, . 24 May 2024, 07:44 UTC. 29 Jun 2024, 04:31 <http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538>.
MHRA style
WikiPatents contributors, '18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)', WikiPatents, , 24 May 2024, 07:44 UTC, <http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538> [accessed 29 June 2024]
Chicago style
WikiPatents contributors, "18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)," WikiPatents, , http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538 (accessed June 29, 2024).
CBE/CSE style
WikiPatents contributors. 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.) [Internet]. WikiPatents, ; 2024 May 24, 07:44 UTC [cited 2024 Jun 29]. Available from: http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538.
Bluebook style
18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.), http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538 (last visited June 29, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538", note = "[Online; accessed 29-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=18388623._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract_(Micron_Technology,_Inc.)&oldid=61538}", note = "[Online; accessed 29-June-2024]" }