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Bibliographic details for Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract
- Page name: Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 24 May 2024 01:35 UTC
- Date retrieved: 29 June 2024 04:33 UTC
- Permanent URL: http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371
- Page Version ID: 60371
Citation styles for Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract
APA style
Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract. (2024, May 24). WikiPatents, . Retrieved 04:33, June 29, 2024 from http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371.
MLA style
"Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract." WikiPatents, . 24 May 2024, 01:35 UTC. 29 Jun 2024, 04:33 <http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371>.
MHRA style
WikiPatents contributors, 'Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract', WikiPatents, , 24 May 2024, 01:35 UTC, <http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371> [accessed 29 June 2024]
Chicago style
WikiPatents contributors, "Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371 (accessed June 29, 2024).
CBE/CSE style
WikiPatents contributors. Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract [Internet]. WikiPatents, ; 2024 May 24, 01:35 UTC [cited 2024 Jun 29]. Available from: http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371.
Bluebook style
Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract, http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371 (last visited June 29, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371", note = "[Online; accessed 29-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "Micron technology, inc. (20240161264). DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=Micron_technology,_inc._(20240161264)._DEFECT_CHARACTERIZATION_IN_SEMICONDUCTOR_DEVICES_BASED_ON_IMAGE_PROCESSING_simplified_abstract&oldid=60371}", note = "[Online; accessed 29-June-2024]" }