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Bibliographic details for 18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)
- Page name: 18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 12 April 2024 07:59 UTC
- Date retrieved: 16 June 2024 15:39 UTC
- Permanent URL: http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221
- Page Version ID: 50221
Citation styles for 18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)
APA style
18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated). (2024, April 12). WikiPatents, . Retrieved 15:39, June 16, 2024 from http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221.
MLA style
"18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)." WikiPatents, . 12 Apr 2024, 07:59 UTC. 16 Jun 2024, 15:39 <http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221>.
MHRA style
WikiPatents contributors, '18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)', WikiPatents, , 12 April 2024, 07:59 UTC, <http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221> [accessed 16 June 2024]
Chicago style
WikiPatents contributors, "18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated)," WikiPatents, , http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221 (accessed June 16, 2024).
CBE/CSE style
WikiPatents contributors. 18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated) [Internet]. WikiPatents, ; 2024 Apr 12, 07:59 UTC [cited 2024 Jun 16]. Available from: http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221.
Bluebook style
18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated), http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221 (last visited June 16, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221", note = "[Online; accessed 16-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "18315349. DESIGN FOR TESTABILITY FOR FAULT DETECTION IN CLOCK GATE CONTROL CIRCUITS simplified abstract (QUALCOMM Incorporated) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=18315349._DESIGN_FOR_TESTABILITY_FOR_FAULT_DETECTION_IN_CLOCK_GATE_CONTROL_CIRCUITS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=50221}", note = "[Online; accessed 16-June-2024]" }