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Bibliographic details for 17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)
- Page name: 17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 25 March 2024 08:54 UTC
- Date retrieved: 16 June 2024 03:29 UTC
- Permanent URL: http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028
- Page Version ID: 45028
Citation styles for 17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)
APA style
17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE). (2024, March 25). WikiPatents, . Retrieved 03:29, June 16, 2024 from http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028.
MLA style
"17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)." WikiPatents, . 25 Mar 2024, 08:54 UTC. 16 Jun 2024, 03:29 <http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028>.
MHRA style
WikiPatents contributors, '17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)', WikiPatents, , 25 March 2024, 08:54 UTC, <http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028> [accessed 16 June 2024]
Chicago style
WikiPatents contributors, "17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)," WikiPatents, , http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028 (accessed June 16, 2024).
CBE/CSE style
WikiPatents contributors. 17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE) [Internet]. WikiPatents, ; 2024 Mar 25, 08:54 UTC [cited 2024 Jun 16]. Available from: http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028.
Bluebook style
17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE), http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028 (last visited June 16, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028", note = "[Online; accessed 16-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "17994858. X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=17994858._X-RAY_REFLECTOMETRY_APPARATUS_AND_METHOD_THEREOF_FOR_MEASURING_THREE_DIMENSIONAL_NANOSTRUCTURES_ON_FLAT_SUBSTRATE_simplified_abstract_(INDUSTRIAL_TECHNOLOGY_RESEARCH_INSTITUTE)&oldid=45028}", note = "[Online; accessed 16-June-2024]" }