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Bibliographic details for 18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation)
- Page name: 18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 25 March 2024 08:09 UTC
- Date retrieved: 26 June 2024 12:23 UTC
- Permanent URL: http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800
- Page Version ID: 44800
Citation styles for 18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation)
APA style
18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation). (2024, March 25). WikiPatents, . Retrieved 12:23, June 26, 2024 from http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800.
MLA style
"18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation)." WikiPatents, . 25 Mar 2024, 08:09 UTC. 26 Jun 2024, 12:23 <http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800>.
MHRA style
WikiPatents contributors, '18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation)', WikiPatents, , 25 March 2024, 08:09 UTC, <http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800> [accessed 26 June 2024]
Chicago style
WikiPatents contributors, "18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation)," WikiPatents, , http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800 (accessed June 26, 2024).
CBE/CSE style
WikiPatents contributors. 18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation) [Internet]. WikiPatents, ; 2024 Mar 25, 08:09 UTC [cited 2024 Jun 26]. Available from: http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800.
Bluebook style
18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation), http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800 (last visited June 26, 2024).
BibTeX entry
@misc{ wiki:xxx,
author = "WikiPatents",
title = "18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation) --- WikiPatents{,} ",
year = "2024",
url = "http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800",
note = "[Online; accessed 26-June-2024]"
}
When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx,
author = "WikiPatents",
title = "18272859. DEFECT INSPECTION DEVICE simplified abstract (Hitachi High-Tech Corporation) --- WikiPatents{,} ",
year = "2024",
url = "\url{http://wikipatents.org/index.php?title=18272859._DEFECT_INSPECTION_DEVICE_simplified_abstract_(Hitachi_High-Tech_Corporation)&oldid=44800}",
note = "[Online; accessed 26-June-2024]"
}
