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Bibliographic details for 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

Citation styles for 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

APA style

18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.). (2024, March 22). WikiPatents, . Retrieved 02:55, June 23, 2024 from http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742.

MLA style

"18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)." WikiPatents, . 22 Mar 2024, 08:16 UTC. 23 Jun 2024, 02:55 <http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742>.

MHRA style

WikiPatents contributors, '18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)', WikiPatents, , 22 March 2024, 08:16 UTC, <http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742> [accessed 23 June 2024]

Chicago style

WikiPatents contributors, "18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)," WikiPatents, , http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742 (accessed June 23, 2024).

CBE/CSE style

WikiPatents contributors. 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.) [Internet]. WikiPatents, ; 2024 Mar 22, 08:16 UTC [cited 2024 Jun 23]. Available from: http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742.

Bluebook style

18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.), http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742 (last visited June 23, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742",
   note = "[Online; accessed 23-June-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742}",
   note = "[Online; accessed 23-June-2024]"
 }


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