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Bibliographic details for 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- Page name: 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 22 March 2024 08:16 UTC
- Date retrieved: 28 June 2024 03:08 UTC
- Permanent URL: http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742
- Page Version ID: 41742
Citation styles for 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
APA style
18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.). (2024, March 22). WikiPatents, . Retrieved 03:08, June 28, 2024 from http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742.
MLA style
"18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)." WikiPatents, . 22 Mar 2024, 08:16 UTC. 28 Jun 2024, 03:08 <http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742>.
MHRA style
WikiPatents contributors, '18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)', WikiPatents, , 22 March 2024, 08:16 UTC, <http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742> [accessed 28 June 2024]
Chicago style
WikiPatents contributors, "18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)," WikiPatents, , http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742 (accessed June 28, 2024).
CBE/CSE style
WikiPatents contributors. 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.) [Internet]. WikiPatents, ; 2024 Mar 22, 08:16 UTC [cited 2024 Jun 28]. Available from: http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742.
Bluebook style
18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.), http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742 (last visited June 28, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742", note = "[Online; accessed 28-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=18521432._METHOD_OF_TESTING_AN_INTEGRATED_CIRCUIT_AND_TESTING_SYSTEM_simplified_abstract_(Taiwan_Semiconductor_Manufacturing_Co.,_Ltd.)&oldid=41742}", note = "[Online; accessed 28-June-2024]" }