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Bibliographic details for 18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

Citation styles for 18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

APA style

18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.). (2024, March 16). WikiPatents, . Retrieved 04:10, September 26, 2024 from http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192.

MLA style

"18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)." WikiPatents, . 16 Mar 2024, 23:40 UTC. 26 Sep 2024, 04:10 <http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192>.

MHRA style

WikiPatents contributors, '18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)', WikiPatents, , 16 March 2024, 23:40 UTC, <http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192> [accessed 26 September 2024]

Chicago style

WikiPatents contributors, "18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)," WikiPatents, , http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192 (accessed September 26, 2024).

CBE/CSE style

WikiPatents contributors. 18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) [Internet]. WikiPatents, ; 2024 Mar 16, 23:40 UTC [cited 2024 Sep 26]. Available from: http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192.

Bluebook style

18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.), http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192 (last visited September 26, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192",
   note = "[Online; accessed 26-September-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18460934. VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=18460934._VIRTUAL_METROLOGY_METHODS_FOR_WAFERS,_PREDICTION_METHODS_FOR_CIRCUIT_CHARACTERISTICS_OF_WAFERS_AND_PROCESS_CONTROL_SYSTEMS_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=37192}",
   note = "[Online; accessed 26-September-2024]"
 }


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