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Bibliographic details for Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract

Citation styles for Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract

APA style

Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract. (2024, October 11). WikiPatents, . Retrieved 07:33, October 19, 2024 from http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566.

MLA style

"Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract." WikiPatents, . 11 Oct 2024, 16:01 UTC. 19 Oct 2024, 07:33 <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566>.

MHRA style

WikiPatents contributors, 'Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract', WikiPatents, , 11 October 2024, 16:01 UTC, <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566> [accessed 19 October 2024]

Chicago style

WikiPatents contributors, "Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566 (accessed October 19, 2024).

CBE/CSE style

WikiPatents contributors. Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract [Internet]. WikiPatents, ; 2024 Oct 11, 16:01 UTC [cited 2024 Oct 19]. Available from: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566.

Bluebook style

Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract, http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566 (last visited October 19, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566",
   note = "[Online; accessed 19-October-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240338287)._SER-DES_TEST_CHIP_AND_METHOD_FOR_MANAGING_INTER-OPERABILITY_DATA_RATE_RANGE_simplified_abstract&oldid=247566}",
   note = "[Online; accessed 19-October-2024]"
 }


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