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Bibliographic details for 18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)

Citation styles for 18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)

APA style

18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA). (2024, September 19). WikiPatents, . Retrieved 17:46, October 22, 2024 from http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049.

MLA style

"18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)." WikiPatents, . 19 Sep 2024, 11:11 UTC. 22 Oct 2024, 17:46 <http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049>.

MHRA style

WikiPatents contributors, '18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)', WikiPatents, , 19 September 2024, 11:11 UTC, <http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049> [accessed 22 October 2024]

Chicago style

WikiPatents contributors, "18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)," WikiPatents, , http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049 (accessed October 22, 2024).

CBE/CSE style

WikiPatents contributors. 18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA) [Internet]. WikiPatents, ; 2024 Sep 19, 11:11 UTC [cited 2024 Oct 22]. Available from: http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049.

Bluebook style

18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA), http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049 (last visited October 22, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049",
   note = "[Online; accessed 22-October-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "18676114. SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=18676114._SEMICONDUCTOR_DEVICE,_INSPECTION_APPARATUS_OF_SEMICONDUCTOR_DEVICE,_AND_METHOD_FOR_INSPECTING_SEMICONDUCTOR_DEVICE_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=236049}",
   note = "[Online; accessed 22-October-2024]"
 }


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