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Bibliographic details for 17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- Page name: 17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 2 January 2024 19:04 UTC
- Date retrieved: 15 June 2024 22:38 UTC
- Permanent URL: http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773
- Page Version ID: 21773
Citation styles for 17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
APA style
17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.). (2024, January 2). WikiPatents, . Retrieved 22:38, June 15, 2024 from http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773.
MLA style
"17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)." WikiPatents, . 2 Jan 2024, 19:04 UTC. 15 Jun 2024, 22:38 <http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773>.
MHRA style
WikiPatents contributors, '17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)', WikiPatents, , 2 January 2024, 19:04 UTC, <http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773> [accessed 15 June 2024]
Chicago style
WikiPatents contributors, "17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)," WikiPatents, , http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773 (accessed June 15, 2024).
CBE/CSE style
WikiPatents contributors. 17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) [Internet]. WikiPatents, ; 2024 Jan 2, 19:04 UTC [cited 2024 Jun 15]. Available from: http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773.
Bluebook style
17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.), http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773 (last visited June 15, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773", note = "[Online; accessed 15-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=17501318._INSPECTION_SYSTEM_OF_SEMICONDUCTOR_WAFER_AND_METHOD_OF_DRIVING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21773}", note = "[Online; accessed 15-June-2024]" }