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Bibliographic details for Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract
- Page name: Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 18 July 2024 05:30 UTC
- Date retrieved: 15 September 2024 13:32 UTC
- Permanent URL: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235
- Page Version ID: 129235
Citation styles for Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract
APA style
Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract. (2024, July 18). WikiPatents, . Retrieved 13:32, September 15, 2024 from http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235.
MLA style
"Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract." WikiPatents, . 18 Jul 2024, 05:30 UTC. 15 Sep 2024, 13:32 <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235>.
MHRA style
WikiPatents contributors, 'Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract', WikiPatents, , 18 July 2024, 05:30 UTC, <http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235> [accessed 15 September 2024]
Chicago style
WikiPatents contributors, "Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235 (accessed September 15, 2024).
CBE/CSE style
WikiPatents contributors. Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract [Internet]. WikiPatents, ; 2024 Jul 18, 05:30 UTC [cited 2024 Sep 15]. Available from: http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235.
Bluebook style
Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract, http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235 (last visited September 15, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235", note = "[Online; accessed 15-September-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=Samsung_electronics_co.,_ltd._(20240241451)._METHOD_OF_MEASURING_OVERLAY_AND_SEMICONDUCTOR_DEVICE_MANUFACTURED_USING_THE_SAME_simplified_abstract&oldid=129235}", note = "[Online; accessed 15-September-2024]" }