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Show new changes starting from 19:09, 19 July 2024
   
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19 July 2024

N    09:06  18407631. SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract (Samsung Electronics Co., Ltd.)‎ diffhist +4,900‎ Wikipatents talk contribs Creating a new page
N    09:02  18528998. METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)‎ diffhist +3,786‎ Wikipatents talk contribs Creating a new page
N    03:10  CANON KABUSHIKI KAISHA patent applications on July 18th, 2024‎ diffhist +71,818‎ Wikipatents talk contribs Creating a new page
N    03:07  Canon kabushiki kaisha (20240242994). CONVEYANCE APPARATUS, CONVEYANCE METHOD, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD simplified abstract‎ diffhist +3,593‎ Wikipatents talk contribs Creating a new page

18 July 2024

N    05:42  Samsung Electronics Co., Ltd. patent applications on July 18th, 2024‎ diffhist +243,406‎ Wikipatents talk contribs Creating a new page
N    05:34  Samsung electronics co., ltd. (20240242985). SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract‎ diffhist +3,620‎ Wikipatents talk contribs Creating a new page
N    05:30  Samsung electronics co., ltd. (20240241451). METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED USING THE SAME simplified abstract‎ diffhist +4,052‎ Wikipatents talk contribs Creating a new page
N    05:28  Intel Corporation patent applications on July 18th, 2024‎ diffhist +65,609‎ Wikipatents talk contribs Creating a new page
N    05:24  Intel corporation (20240241446). METHODS AND APPARATUS TO REDUCE EXTREME ULTRAVIOLET LIGHT FOR PHOTOLITHOGRAPHY simplified abstract‎ diffhist +4,557‎ Wikipatents talk contribs Creating a new page

15 July 2024

N    14:42  18405339. MEASURING DEVICE AND MEASURING METHOD simplified abstract (Kioxia Corporation)‎ diffhist +4,419‎ Wikipatents talk contribs Creating a new page
N    13:55  18547470. SUBSTRATE RESTRAINING SYSTEM simplified abstract (ASML NETHERLANDS B.V.)‎ diffhist +3,404‎ Wikipatents talk contribs Creating a new page
N    13:54  18612659. LIGHT SOURCES AND METHODS OF CONTROLLING; DEVICES AND METHODS FOR USE IN MEASUREMENT APPLICATIONS simplified abstract (ASML NETHERLANDS B.V.)‎ diffhist +4,007‎ Wikipatents talk contribs Creating a new page
N    13:54  18279694. OPERATING A METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF simplified abstract (ASML NETHERLANDS B.V.)‎ diffhist +3,275‎ Wikipatents talk contribs Creating a new page
N    13:54  18441710. DARK FIELD MICROSCOPE simplified abstract (ASML NETHERLANDS B.V.)‎ diffhist +3,102‎ Wikipatents talk contribs Creating a new page
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