Category:KAZUHIRO MORIMOTO: Difference between revisions
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=== Executive Summary === | === Executive Summary === | ||
KAZUHIRO MORIMOTO is an inventor who has filed | KAZUHIRO MORIMOTO is an inventor who has filed 15 patents. Their primary areas of innovation include No explanation available (7 patents), Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors (3 patents), No explanation available (3 patents), and they have worked with companies such as CANON KABUSHIKI KAISHA (15 patents). Their most frequent collaborators include [[Category:HIROSHI SEKINE|HIROSHI SEKINE]] (5 collaborations), [[Category:YU MAEHASHI|YU MAEHASHI]] (3 collaborations), [[Category:TOMOYA SASAGO|TOMOYA SASAGO]] (2 collaborations). | ||
=== Patent Filing Activity === | === Patent Filing Activity === | ||
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==== List of Technology Areas ==== | ==== List of Technology Areas ==== | ||
* [[:Category:CPC_H10F39/811|H10F39/811]] (No explanation available): | * [[:Category:CPC_H10F39/811|H10F39/811]] (No explanation available): 7 patents | ||
* [[:Category:CPC_H04N25/79|H04N25/79]] (Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors): 3 patents | |||
* [[:Category:CPC_H10F39/809|H10F39/809]] (No explanation available): 3 patents | |||
* [[:Category:CPC_H10F39/807|H10F39/807]] (No explanation available): 3 patents | |||
* [[:Category:CPC_G01S7/4816|G01S7/4816]] ({of receivers alone}): 2 patents | |||
* [[:Category:CPC_H04N25/705|H04N25/705]] (Pixels for depth measurement, e.g. RGBZ): 2 patents | * [[:Category:CPC_H04N25/705|H04N25/705]] (Pixels for depth measurement, e.g. RGBZ): 2 patents | ||
* [[:Category:CPC_H04N25/77|H04N25/77]] (Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components): 2 patents | * [[:Category:CPC_H04N25/77|H04N25/77]] (Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components): 2 patents | ||
* [[:Category:CPC_H04N25/ | * [[:Category:CPC_H04N25/773|H04N25/773]] (comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]): 2 patents | ||
* [[:Category:CPC_H10F39/ | * [[:Category:CPC_H10F77/959|H10F77/959]] (No explanation available): 2 patents | ||
* [[:Category:CPC_H10F39/ | * [[:Category:CPC_H10F39/182|H10F39/182]] (No explanation available): 2 patents | ||
* [[:Category:CPC_H10F39/199|H10F39/199]] (No explanation available): 2 patents | |||
* [[:Category:CPC_H10F39/8033|H10F39/8033]] (No explanation available): 1 patents | |||
* [[:Category:CPC_G01S7/51|G01S7/51]] (Display arrangements): 1 patents | |||
* [[:Category:CPC_G01S17/894|G01S17/894]] (3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar): 1 patents | |||
* [[:Category:CPC_G01S17/931|G01S17/931]] (RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES): 1 patents | |||
* [[:Category:CPC_H04N25/68|H04N25/68]] (applied to defects): 1 patents | * [[:Category:CPC_H04N25/68|H04N25/68]] (applied to defects): 1 patents | ||
* [[:Category:CPC_H01L27/142|H01L27/142]] (Energy conversion devices (photovoltaic modules or arrays of single photovoltaic cells comprising bypass diodes integrated or directly associated with the devices): 1 patents | * [[:Category:CPC_H01L27/142|H01L27/142]] (Energy conversion devices (photovoltaic modules or arrays of single photovoltaic cells comprising bypass diodes integrated or directly associated with the devices): 1 patents | ||
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* [[:Category:CPC_H01L31/02027|H01L31/02027]] ({for devices working in avalanche mode}): 1 patents | * [[:Category:CPC_H01L31/02027|H01L31/02027]] ({for devices working in avalanche mode}): 1 patents | ||
* [[:Category:CPC_H04N25/709|H04N25/709]] (Circuitry for control of the power supply): 1 patents | * [[:Category:CPC_H04N25/709|H04N25/709]] (Circuitry for control of the power supply): 1 patents | ||
* [[:Category:CPC_H04N25/767|H04N25/767]] (Horizontal readout lines, multiplexers or registers): 1 patents | * [[:Category:CPC_H04N25/767|H04N25/767]] (Horizontal readout lines, multiplexers or registers): 1 patents | ||
* [[:Category:CPC_H04N25/768|H04N25/768]] (Addressed sensors, e.g. MOS or CMOS sensors): 1 patents | * [[:Category:CPC_H04N25/768|H04N25/768]] (Addressed sensors, e.g. MOS or CMOS sensors): 1 patents | ||
* [[:Category:CPC_H04N25/7795|H04N25/7795]] ({Circuitry for generating timing or clock signals}): 1 patents | * [[:Category:CPC_H04N25/7795|H04N25/7795]] ({Circuitry for generating timing or clock signals}): 1 patents | ||
* [[:Category:CPC_H10F39/026|H10F39/026]] (No explanation available): 1 patents | * [[:Category:CPC_H10F39/026|H10F39/026]] (No explanation available): 1 patents | ||
* [[:Category:CPC_H01L23/544|H01L23/544]] (Marks applied to semiconductor devices {or parts}, e.g. registration marks, {alignment structures, wafer maps (test patterns for characterising or monitoring manufacturing processes): 1 patents | * [[:Category:CPC_H01L23/544|H01L23/544]] (Marks applied to semiconductor devices {or parts}, e.g. registration marks, {alignment structures, wafer maps (test patterns for characterising or monitoring manufacturing processes): 1 patents | ||
* [[:Category:CPC_H01L2223/5446|H01L2223/5446]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents | * [[:Category:CPC_H01L2223/5446|H01L2223/5446]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents | ||
* [[:Category:CPC_H10F39/8023|H10F39/8023]] (No explanation available): 1 patents | * [[:Category:CPC_H10F39/8023|H10F39/8023]] (No explanation available): 1 patents | ||
* [[:Category:CPC_H10F39/8063|H10F39/8063]] (No explanation available): 1 patents | * [[:Category:CPC_H10F39/8063|H10F39/8063]] (No explanation available): 1 patents | ||
* [[:Category:CPC_H10F39/ | * [[:Category:CPC_H04N25/771|H04N25/771]] (comprising storage means other than floating diffusion): 1 patents | ||
* [[:Category:CPC_H04N25/779|H04N25/779]] (Circuitry for scanning or addressing the pixel array): 1 patents | |||
* [[:Category:CPC_H10F30/225|H10F30/225]] (No explanation available): 1 patents | |||
* [[:Category:CPC_H10F39/806|H10F39/806]] (No explanation available): 1 patents | |||
* [[:Category:CPC_H10F39/8067|H10F39/8067]] (No explanation available): 1 patents | |||
* [[:Category:CPC_G01S7/487|G01S7/487]] (Extracting wanted echo signals {, e.g. pulse detection}): 1 patents | |||
* [[:Category:CPC_G01S7/4865|G01S7/4865]] (Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak (peak detection in noise, signal conditioning): 1 patents | |||
* [[:Category:CPC_G01S17/10|G01S17/10]] (RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES): 1 patents | |||
* [[:Category:CPC_H01L23/5228|H01L23/5228]] ({Resistive arrangements or effects of, or between, wiring layers (other resistive arrangements): 1 patents | |||
=== Companies === | === Companies === | ||
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==== List of Companies ==== | ==== List of Companies ==== | ||
* CANON KABUSHIKI KAISHA: | * CANON KABUSHIKI KAISHA: 15 patents | ||
=== Collaborators === | === Collaborators === | ||
* [[:Category:HIROSHI SEKINE|HIROSHI SEKINE]][[Category:HIROSHI SEKINE]] ( | * [[:Category:HIROSHI SEKINE|HIROSHI SEKINE]][[Category:HIROSHI SEKINE]] (5 collaborations) | ||
* [[:Category:YU MAEHASHI|YU MAEHASHI]][[Category:YU MAEHASHI]] (3 collaborations) | * [[:Category:YU MAEHASHI|YU MAEHASHI]][[Category:YU MAEHASHI]] (3 collaborations) | ||
* [[:Category:TOMOYA SASAGO|TOMOYA SASAGO]][[Category:TOMOYA SASAGO]] (2 collaborations) | * [[:Category:TOMOYA SASAGO|TOMOYA SASAGO]][[Category:TOMOYA SASAGO]] (2 collaborations) | ||
* [[:Category:JUNJI IWATA|JUNJI IWATA]][[Category:JUNJI IWATA]] (2 collaborations) | * [[:Category:JUNJI IWATA|JUNJI IWATA]][[Category:JUNJI IWATA]] (2 collaborations) | ||
* [[:Category:DAIKI SHIRAHIGE|DAIKI SHIRAHIGE]][[Category:DAIKI SHIRAHIGE]] (2 collaborations) | |||
* [[:Category:AYMAN TAREK ABDELGHAFAR|AYMAN TAREK ABDELGHAFAR]][[Category:AYMAN TAREK ABDELGHAFAR]] (1 collaborations) | |||
* [[:Category:NAOKI ISODA|NAOKI ISODA]][[Category:NAOKI ISODA]] (1 collaborations) | * [[:Category:NAOKI ISODA|NAOKI ISODA]][[Category:NAOKI ISODA]] (1 collaborations) | ||
* [[:Category:YASUSHI MATSUNO|YASUSHI MATSUNO]][[Category:YASUSHI MATSUNO]] (1 collaborations) | * [[:Category:YASUSHI MATSUNO|YASUSHI MATSUNO]][[Category:YASUSHI MATSUNO]] (1 collaborations) | ||
* [[:Category:WATARU ENDO|WATARU ENDO]][[Category:WATARU ENDO]] (1 collaborations) | * [[:Category:WATARU ENDO|WATARU ENDO]][[Category:WATARU ENDO]] (1 collaborations) | ||
* [[:Category:YASUHARU OTA|YASUHARU OTA]][[Category:YASUHARU OTA]] (1 collaborations) | |||
* [[:Category:KOSEI UEHIRA|KOSEI UEHIRA]][[Category:KOSEI UEHIRA]] (1 collaborations) | * [[:Category:KOSEI UEHIRA|KOSEI UEHIRA]][[Category:KOSEI UEHIRA]] (1 collaborations) | ||
* [[:Category:HIROYUKI TSUCHIYA|HIROYUKI TSUCHIYA]][[Category:HIROYUKI TSUCHIYA]] (1 collaborations) | * [[:Category:HIROYUKI TSUCHIYA|HIROYUKI TSUCHIYA]][[Category:HIROYUKI TSUCHIYA]] (1 collaborations) | ||
Latest revision as of 14:03, 2 May 2025
KAZUHIRO MORIMOTO
Executive Summary
KAZUHIRO MORIMOTO is an inventor who has filed 15 patents. Their primary areas of innovation include No explanation available (7 patents), Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors (3 patents), No explanation available (3 patents), and they have worked with companies such as CANON KABUSHIKI KAISHA (15 patents). Their most frequent collaborators include (5 collaborations), (3 collaborations), (2 collaborations).
Patent Filing Activity
Technology Areas
List of Technology Areas
- H10F39/811 (No explanation available): 7 patents
- H04N25/79 (Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors): 3 patents
- H10F39/809 (No explanation available): 3 patents
- H10F39/807 (No explanation available): 3 patents
- G01S7/4816 ({of receivers alone}): 2 patents
- H04N25/705 (Pixels for depth measurement, e.g. RGBZ): 2 patents
- H04N25/77 (Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components): 2 patents
- H04N25/773 (comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]): 2 patents
- H10F77/959 (No explanation available): 2 patents
- H10F39/182 (No explanation available): 2 patents
- H10F39/199 (No explanation available): 2 patents
- H10F39/8033 (No explanation available): 1 patents
- G01S7/51 (Display arrangements): 1 patents
- G01S17/894 (3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar): 1 patents
- G01S17/931 (RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES): 1 patents
- H04N25/68 (applied to defects): 1 patents
- H01L27/142 (Energy conversion devices (photovoltaic modules or arrays of single photovoltaic cells comprising bypass diodes integrated or directly associated with the devices): 1 patents
- H01L27/14643 ({Photodiode arrays; MOS imagers}): 1 patents
- H01L31/02027 ({for devices working in avalanche mode}): 1 patents
- H04N25/709 (Circuitry for control of the power supply): 1 patents
- H04N25/767 (Horizontal readout lines, multiplexers or registers): 1 patents
- H04N25/768 (Addressed sensors, e.g. MOS or CMOS sensors): 1 patents
- H04N25/7795 ({Circuitry for generating timing or clock signals}): 1 patents
- H10F39/026 (No explanation available): 1 patents
- H01L23/544 (Marks applied to semiconductor devices {or parts}, e.g. registration marks, {alignment structures, wafer maps (test patterns for characterising or monitoring manufacturing processes): 1 patents
- H01L2223/5446 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
- H10F39/8023 (No explanation available): 1 patents
- H10F39/8063 (No explanation available): 1 patents
- H04N25/771 (comprising storage means other than floating diffusion): 1 patents
- H04N25/779 (Circuitry for scanning or addressing the pixel array): 1 patents
- H10F30/225 (No explanation available): 1 patents
- H10F39/806 (No explanation available): 1 patents
- H10F39/8067 (No explanation available): 1 patents
- G01S7/487 (Extracting wanted echo signals {, e.g. pulse detection}): 1 patents
- G01S7/4865 (Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak (peak detection in noise, signal conditioning): 1 patents
- G01S17/10 (RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES): 1 patents
- H01L23/5228 ({Resistive arrangements or effects of, or between, wiring layers (other resistive arrangements): 1 patents
Companies
List of Companies
- CANON KABUSHIKI KAISHA: 15 patents
Collaborators
- HIROSHI SEKINE (5 collaborations)
- YU MAEHASHI (3 collaborations)
- TOMOYA SASAGO (2 collaborations)
- JUNJI IWATA (2 collaborations)
- DAIKI SHIRAHIGE (2 collaborations)
- AYMAN TAREK ABDELGHAFAR (1 collaborations)
- NAOKI ISODA (1 collaborations)
- YASUSHI MATSUNO (1 collaborations)
- WATARU ENDO (1 collaborations)
- YASUHARU OTA (1 collaborations)
- KOSEI UEHIRA (1 collaborations)
- HIROYUKI TSUCHIYA (1 collaborations)
Subcategories
This category has the following 2 subcategories, out of 2 total.