Qualcomm incorporated (20250130957). AUTOMATED DAMAGE CONDITION DETECTION AND DATA BACKUP IN AN ELECTRONIC DEVICE: Difference between revisions
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=AUTOMATED DAMAGE CONDITION DETECTION AND DATA BACKUP IN AN ELECTRONIC DEVICE= | =AUTOMATED DAMAGE CONDITION DETECTION AND DATA BACKUP IN AN ELECTRONIC DEVICE= | ||
Latest revision as of 15:32, 29 April 2025
AUTOMATED DAMAGE CONDITION DETECTION AND DATA BACKUP IN AN ELECTRONIC DEVICE
Organization Name
Inventor(s)
Hari Krishna Munagala of Giddalur IN
Rajeevalochana R. of Hyderabad IN
Praveen Kandukuri of Chilakaluripet IN
Hargovind Prasad Bansal of Bharatpur IN
AUTOMATED DAMAGE CONDITION DETECTION AND DATA BACKUP IN AN ELECTRONIC DEVICE
This abstract first appeared for US patent application 20250130957 titled 'AUTOMATED DAMAGE CONDITION DETECTION AND DATA BACKUP IN AN ELECTRONIC DEVICE
Original Abstract Submitted
this disclosure provides systems, methods, and devices for memory systems that support automatic backup of data upon detection of a potential damage condition. in a first aspect, a method includes detecting, by at least one processor of an apparatus, a potential damage condition for the apparatus and, in response to detection of the potential damage condition for the apparatus, performing, by the at least one processor of the apparatus, a data backup of data stored in at least one memory of the apparatus. other aspects and features are also claimed and described.
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