Samsung electronics co., ltd. (20250006792). SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME: Difference between revisions
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==Inventor(s)== | ==Inventor(s)== | ||
[[:Category:Tae Hyun Ryu of Suwon-si | [[:Category:Tae Hyun Ryu of Suwon-si KR|Tae Hyun Ryu of Suwon-si KR]][[Category:Tae Hyun Ryu of Suwon-si KR]] | ||
[[:Category:Dong Hoon Hwang of Suwon-si | [[:Category:Dong Hoon Hwang of Suwon-si KR|Dong Hoon Hwang of Suwon-si KR]][[Category:Dong Hoon Hwang of Suwon-si KR]] | ||
[[:Category:Myung Il Kang of Suwon-si | [[:Category:Myung Il Kang of Suwon-si KR|Myung Il Kang of Suwon-si KR]][[Category:Myung Il Kang of Suwon-si KR]] | ||
[[:Category:Hyo Jin Kim of Suwon-si | [[:Category:Hyo Jin Kim of Suwon-si KR|Hyo Jin Kim of Suwon-si KR]][[Category:Hyo Jin Kim of Suwon-si KR]] | ||
[[:Category:Byung Ho Moon of Suwon-si | [[:Category:Byung Ho Moon of Suwon-si KR|Byung Ho Moon of Suwon-si KR]][[Category:Byung Ho Moon of Suwon-si KR]] | ||
[[:Category:Nam Hyun Lee of Suwon-si | [[:Category:Nam Hyun Lee of Suwon-si KR|Nam Hyun Lee of Suwon-si KR]][[Category:Nam Hyun Lee of Suwon-si KR]] | ||
==SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME== | ==SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME== | ||
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This abstract first appeared for US patent application 20250006792 titled 'SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | This abstract first appeared for US patent application 20250006792 titled 'SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | ||
==Original Abstract Submitted== | ==Original Abstract Submitted== |
Latest revision as of 02:49, 25 March 2025
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
Organization Name
Inventor(s)
Dong Hoon Hwang of Suwon-si KR
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
This abstract first appeared for US patent application 20250006792 titled 'SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
Original Abstract Submitted
a semiconductor device includes a first and second channel separation structures extending in a first direction and spaced apart from each other in a second direction, first gate structures spaced apart from each other in the first direction between the first and second channel separation structures and in contact with the first and second channel separation structures, first and second channel patterns including first and second sheet patterns, respectively, spaced apart from each other in a third direction and in contact with the corresponding first and second channel separation structures, first and second source/drain patterns between the first and second channel separation structures, the first source/drain patterns in contact with the first channel patterns and the first channel separation structure, the second source/drain patterns in contact with the second channel patterns and the second channel separation structure, and first gate separation structures between the first and second source/drain patterns.
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