Jump to content

EDUCATION4SIGHT GmbH (20250061403). SYSTEMS AND METHODS FOR PROVIDING KNOWLEDGE BASES OF ASSESSMENT ITEMS: Difference between revisions

From WikiPatents
Creating a new page
 
Creating a new page
 
Line 8: Line 8:


[[Category:EDUCATION4SIGHT GmbH]]
[[Category:EDUCATION4SIGHT GmbH]]
==Inventor(s)==
[[:Category:Brahim Hnich of Sfax (TN)|Brahim Hnich of Sfax (TN)]][[Category:Brahim Hnich of Sfax (TN)]]
[[:Category:Lassaad Essafi of Wettstetten (DE)|Lassaad Essafi of Wettstetten (DE)]][[Category:Lassaad Essafi of Wettstetten (DE)]]
==SYSTEMS AND METHODS FOR PROVIDING KNOWLEDGE BASES OF ASSESSMENT ITEMS==
This abstract first appeared for US patent application 20250061403 titled 'SYSTEMS AND METHODS FOR PROVIDING KNOWLEDGE BASES OF ASSESSMENT ITEMS
==Original Abstract Submitted==
systems and methods for education instrumentation can include a computer system receiving assessment data indicative of performances of a plurality of respondents with respect to a plurality of assessment items. the computer system can determine, using the assessment data, item difficulty parameters of the plurality of assessment items and respondent ability parameters of the plurality of respondents. the computer system can determine item-specific parameters for each assessment item of the plurality of assessment items, using the item difficulty parameters of the plurality of assessment items and respondent ability parameters of the plurality of respondents. the computer system can determine contextual parameters common to the plurality of assessment items. the computer system can provide access to the item-specific parameters of the plurality of assessment items and the one or more contextual parameters.
[[Category:G06Q10/0637]]
[[Category:G06Q10/0639]]
[[Category:G09B19/00]]
[[Category:CPC_G06Q10/06375]]

Latest revision as of 04:15, 19 March 2025

SYSTEMS AND METHODS FOR PROVIDING KNOWLEDGE BASES OF ASSESSMENT ITEMS

Organization Name

EDUCATION4SIGHT GmbH

Inventor(s)

Brahim Hnich of Sfax (TN)

Lassaad Essafi of Wettstetten (DE)

SYSTEMS AND METHODS FOR PROVIDING KNOWLEDGE BASES OF ASSESSMENT ITEMS

This abstract first appeared for US patent application 20250061403 titled 'SYSTEMS AND METHODS FOR PROVIDING KNOWLEDGE BASES OF ASSESSMENT ITEMS

Original Abstract Submitted

systems and methods for education instrumentation can include a computer system receiving assessment data indicative of performances of a plurality of respondents with respect to a plurality of assessment items. the computer system can determine, using the assessment data, item difficulty parameters of the plurality of assessment items and respondent ability parameters of the plurality of respondents. the computer system can determine item-specific parameters for each assessment item of the plurality of assessment items, using the item difficulty parameters of the plurality of assessment items and respondent ability parameters of the plurality of respondents. the computer system can determine contextual parameters common to the plurality of assessment items. the computer system can provide access to the item-specific parameters of the plurality of assessment items and the one or more contextual parameters.

(Ad) Transform your business with AI in minutes, not months

Custom AI strategy tailored to your specific industry needs
Step-by-step implementation with measurable ROI
5-minute setup that requires zero technical skills
Get your AI playbook

Trusted by 1,000+ companies worldwide

Cookies help us deliver our services. By using our services, you agree to our use of cookies.