Difference between revisions of "Category:Eric Chih-Fang Liu of Albany NY (US)"

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(Updating Category:Eric_Chih-Fang_Liu_of_Albany_NY_(US))
 
(Updating Category:Eric_Chih-Fang_Liu_of_Albany_NY_(US))
 
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=== Executive Summary ===
 
=== Executive Summary ===
Eric Chih-Fang Liu of Albany NY (US) is an inventor who has filed 9 patents. Their primary areas of innovation include No explanation available (5 patents), No explanation available (4 patents), No explanation available (3 patents), and they have worked with companies such as Tokyo Electron Limited (9 patents). Their most frequent collaborators include [[Category:Steven Grzeskowiak of Albany NY (US)|Steven Grzeskowiak of Albany NY (US)]] (4 collaborations), [[Category:Shan Hu of Albany NY (US)|Shan Hu of Albany NY (US)]] (3 collaborations), [[Category:Henan Zhang of Albany NY (US)|Henan Zhang of Albany NY (US)]] (3 collaborations).
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Eric Chih-Fang Liu of Albany NY (US) is an inventor who has filed 9 patents. Their primary areas of innovation include {using masks} (5 patents), comprising inorganic layers (4 patents), {characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment} (3 patents), and they have worked with companies such as Tokyo Electron Limited (9 patents). Their most frequent collaborators include [[Category:Steven Grzeskowiak of Albany NY (US)|Steven Grzeskowiak of Albany NY (US)]] (4 collaborations), [[Category:Shan Hu of Albany NY (US)|Shan Hu of Albany NY (US)]] (3 collaborations), [[Category:Henan Zhang of Albany NY (US)|Henan Zhang of Albany NY (US)]] (3 collaborations).
  
 
=== Patent Filing Activity ===
 
=== Patent Filing Activity ===
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==== List of Technology Areas ====
 
==== List of Technology Areas ====
* [[:Category:CPC_H01L21/31144|H01L21/31144]] (No explanation available): 5 patents
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* [[:Category:CPC_H01L21/31144|H01L21/31144]] ({using masks}): 5 patents
* [[:Category:CPC_H01L21/0332|H01L21/0332]] (No explanation available): 4 patents
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* [[:Category:CPC_H01L21/0332|H01L21/0332]] (comprising inorganic layers): 4 patents
* [[:Category:CPC_H01L21/0337|H01L21/0337]] (No explanation available): 3 patents
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* [[:Category:CPC_H01L21/0337|H01L21/0337]] ({characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment}): 3 patents
* [[:Category:CPC_H01L21/31111|H01L21/31111]] (No explanation available): 2 patents
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* [[:Category:CPC_H01L21/31111|H01L21/31111]] ({by chemical means}): 2 patents
* [[:Category:CPC_H01L21/0338|H01L21/0338]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/0338|H01L21/0338]] ({Process specially adapted to improve the resolution of the mask}): 1 patents
* [[:Category:CPC_G03F7/0042|G03F7/0042]] (No explanation available): 1 patents
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* [[:Category:CPC_G03F7/0042|G03F7/0042]] ({with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists  (): 1 patents
* [[:Category:CPC_H01L21/027|H01L21/027]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/027|H01L21/027]] (Making masks on semiconductor bodies for further photolithographic processing not provided for in group): 1 patents
* [[:Category:CPC_G03F7/70033|G03F7/70033]] (No explanation available): 1 patents
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* [[:Category:CPC_G03F7/70033|G03F7/70033]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F7/70733|G03F7/70733]] (No explanation available): 1 patents
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* [[:Category:CPC_G03F7/70733|G03F7/70733]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_H01J37/32743|H01J37/32743]] (No explanation available): 1 patents
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* [[:Category:CPC_H01J37/32743|H01J37/32743]] (Gas-filled discharge tubes  (heating by discharge): 1 patents
* [[:Category:CPC_H01J37/32899|H01J37/32899]] (No explanation available): 1 patents
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* [[:Category:CPC_H01J37/32899|H01J37/32899]] (Gas-filled discharge tubes  (heating by discharge): 1 patents
* [[:Category:CPC_H01J2237/334|H01J2237/334]] (No explanation available): 1 patents
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* [[:Category:CPC_H01J2237/334|H01J2237/334]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 1 patents
* [[:Category:CPC_H01L21/76802|H01L21/76802]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/76802|H01L21/76802]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
* [[:Category:CPC_H01L21/0276|H01L21/0276]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/0276|H01L21/0276]] ({using an anti-reflective coating  (anti-reflective coating for lithography in general): 1 patents
* [[:Category:CPC_H01L21/32139|H01L21/32139]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/32139|H01L21/32139]] ({using masks}): 1 patents
* [[:Category:CPC_H01L21/31055|H01L21/31055]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/31055|H01L21/31055]] ({the removal being a chemical etching step, e.g. dry etching  (etching per se): 1 patents
* [[:Category:CPC_H01L21/7682|H01L21/7682]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/7682|H01L21/7682]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
* [[:Category:CPC_H01L21/76819|H01L21/76819]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/76819|H01L21/76819]] ({Smoothing of the dielectric  (planarisation of insulating materials per se): 1 patents
* [[:Category:CPC_H01L21/76831|H01L21/76831]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/76831|H01L21/76831]] ({in via holes or trenches, e.g. non-conductive sidewall liners}): 1 patents
* [[:Category:CPC_H01L21/0271|H01L21/0271]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/0271|H01L21/0271]] ({comprising organic layers}): 1 patents
* [[:Category:CPC_H01L21/31116|H01L21/31116]] (No explanation available): 1 patents
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* [[:Category:CPC_H01L21/31116|H01L21/31116]] ({by dry-etching}): 1 patents
  
 
=== Companies ===
 
=== Companies ===

Latest revision as of 09:06, 19 July 2024

Eric Chih-Fang Liu of Albany NY (US)

Executive Summary

Eric Chih-Fang Liu of Albany NY (US) is an inventor who has filed 9 patents. Their primary areas of innovation include {using masks} (5 patents), comprising inorganic layers (4 patents), {characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment} (3 patents), and they have worked with companies such as Tokyo Electron Limited (9 patents). Their most frequent collaborators include (4 collaborations), (3 collaborations), (3 collaborations).

Patent Filing Activity

Eric Chih-Fang Liu of Albany NY (US) Monthly Patent Applications.png

Technology Areas

Eric Chih-Fang Liu of Albany NY (US) Top Technology Areas.png

List of Technology Areas

  • H01L21/31144 ({using masks}): 5 patents
  • H01L21/0332 (comprising inorganic layers): 4 patents
  • H01L21/0337 ({characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment}): 3 patents
  • H01L21/31111 ({by chemical means}): 2 patents
  • H01L21/0338 ({Process specially adapted to improve the resolution of the mask}): 1 patents
  • G03F7/0042 ({with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists (): 1 patents
  • H01L21/027 (Making masks on semiconductor bodies for further photolithographic processing not provided for in group): 1 patents
  • G03F7/70033 (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices): 1 patents
  • G03F7/70733 (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices): 1 patents
  • H01J37/32743 (Gas-filled discharge tubes (heating by discharge): 1 patents
  • H01J37/32899 (Gas-filled discharge tubes (heating by discharge): 1 patents
  • H01J2237/334 (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps): 1 patents
  • H01L21/76802 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/0276 ({using an anti-reflective coating (anti-reflective coating for lithography in general): 1 patents
  • H01L21/32139 ({using masks}): 1 patents
  • H01L21/31055 ({the removal being a chemical etching step, e.g. dry etching (etching per se): 1 patents
  • H01L21/7682 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/76819 ({Smoothing of the dielectric (planarisation of insulating materials per se): 1 patents
  • H01L21/76831 ({in via holes or trenches, e.g. non-conductive sidewall liners}): 1 patents
  • H01L21/0271 ({comprising organic layers}): 1 patents
  • H01L21/31116 ({by dry-etching}): 1 patents

Companies

Eric Chih-Fang Liu of Albany NY (US) Top Companies.png

List of Companies

  • Tokyo Electron Limited: 9 patents

Collaborators