Difference between revisions of "Category:John D. Hopkins of Meridian ID (US)"

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=== Executive Summary ===
 
=== Executive Summary ===
John D. Hopkins of Meridian ID (US) is an inventor who has filed 5 patents. Their primary areas of innovation include ELECTRONIC MEMORY DEVICES (4 patents), ELECTRONIC MEMORY DEVICES (4 patents), ELECTRONIC MEMORY DEVICES (3 patents), and they have worked with companies such as Lodestar Licensing Group LLC (5 patents). Their most frequent collaborators include [[Category:Lifang Xu of Boise ID (US)|Lifang Xu of Boise ID (US)]] (3 collaborations), [[Category:Jordan D. Greenlee of Boise ID (US)|Jordan D. Greenlee of Boise ID (US)]] (2 collaborations), [[Category:Justin Dorhout of Boise ID (US)|Justin Dorhout of Boise ID (US)]] (1 collaborations).
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John D. Hopkins of Meridian ID (US) is an inventor who has filed 25 patents. Their primary areas of innovation include ELECTRONIC MEMORY DEVICES (14 patents), ELECTRONIC MEMORY DEVICES (14 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (9 patents), and they have worked with companies such as Micron Technology, Inc. (25 patents). Their most frequent collaborators include [[Category:Alyssa N. Scarbrough of Boise ID (US)|Alyssa N. Scarbrough of Boise ID (US)]] (11 collaborations), [[Category:Jordan D. Greenlee of Boise ID (US)|Jordan D. Greenlee of Boise ID (US)]] (10 collaborations), [[Category:Darwin A. Clampitt of Wilder ID (US)|Darwin A. Clampitt of Wilder ID (US)]] (3 collaborations).
  
 
=== Patent Filing Activity ===
 
=== Patent Filing Activity ===
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==== List of Technology Areas ====
 
==== List of Technology Areas ====
* [[:Category:CPC_H10B43/27|H10B43/27]] (ELECTRONIC MEMORY DEVICES): 4 patents
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* [[:Category:CPC_H10B43/27|H10B43/27]] (ELECTRONIC MEMORY DEVICES): 14 patents
* [[:Category:CPC_H10B41/27|H10B41/27]] (ELECTRONIC MEMORY DEVICES): 4 patents
+
* [[:Category:CPC_H10B41/27|H10B41/27]] (ELECTRONIC MEMORY DEVICES): 14 patents
* [[:Category:CPC_H10B41/10|H10B41/10]] (ELECTRONIC MEMORY DEVICES): 3 patents
+
* [[:Category:CPC_H01L27/11582|H01L27/11582]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 9 patents
* [[:Category:CPC_H10B43/35|H10B43/35]] (ELECTRONIC MEMORY DEVICES): 3 patents
+
* [[:Category:CPC_H10B43/35|H10B43/35]] (ELECTRONIC MEMORY DEVICES): 5 patents
* [[:Category:CPC_H10B41/35|H10B41/35]] (ELECTRONIC MEMORY DEVICES): 3 patents
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* [[:Category:CPC_H01L27/11556|H01L27/11556]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 5 patents
* [[:Category:CPC_H10B43/10|H10B43/10]] (ELECTRONIC MEMORY DEVICES): 2 patents
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* [[:Category:CPC_H10B41/35|H10B41/35]] (ELECTRONIC MEMORY DEVICES): 4 patents
* [[:Category:CPC_H01L21/76805|H01L21/76805]] ({the opening being a via or contact hole penetrating the underlying conductor}): 2 patents
+
* [[:Category:CPC_H10B41/10|H10B41/10]] (ELECTRONIC MEMORY DEVICES): 4 patents
* [[:Category:CPC_H01L21/76816|H01L21/76816]] ({Aspects relating to the layout of the pattern or to the size of vias or trenches  (layout of the interconnections per se): 2 patents
+
* [[:Category:CPC_H10B43/10|H10B43/10]] (ELECTRONIC MEMORY DEVICES): 4 patents
* [[:Category:CPC_H01L21/76877|H01L21/76877]] ({Thin films associated with contacts of capacitors}): 2 patents
+
* [[:Category:CPC_H01L23/5226|H01L23/5226]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L21/76895|H01L21/76895]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 2 patents
+
* [[:Category:CPC_H10B41/41|H10B41/41]] (ELECTRONIC MEMORY DEVICES): 3 patents
* [[:Category:CPC_H01L23/5226|H01L23/5226]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
+
* [[:Category:CPC_H10B43/40|H10B43/40]] (ELECTRONIC MEMORY DEVICES): 3 patents
* [[:Category:CPC_H01L23/5283|H01L23/5283]] ({Geometry or} layout of the interconnection structure {(): 2 patents
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* [[:Category:CPC_G11C16/0483|G11C16/0483]] ({comprising cells having several storage transistors connected in series}): 3 patents
* [[:Category:CPC_H01L23/535|H01L23/535]] (including internal interconnections, e.g. cross-under constructions {(internal lead connections): 2 patents
+
* [[:Category:CPC_H01L23/535|H01L23/535]] (including internal interconnections, e.g. cross-under constructions {(internal lead connections): 3 patents
* [[:Category:CPC_H10B43/40|H10B43/40]] (ELECTRONIC MEMORY DEVICES): 1 patents
+
* [[:Category:CPC_H01L27/11565|H01L27/11565]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L21/76826|H01L21/76826]] ({by contacting the layer with gases, liquids or plasmas}): 1 patents
+
* [[:Category:CPC_H01L27/1157|H01L27/1157]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H10B41/41|H10B41/41]] (ELECTRONIC MEMORY DEVICES): 1 patents
+
* [[:Category:CPC_G11C5/06|G11C5/06]] (STATIC STORES  (semiconductor memory devices): 2 patents
 +
* [[:Category:CPC_H01L29/40117|H01L29/40117]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 +
* [[:Category:CPC_H01L21/28518|H01L21/28518]] (from a gas or vapour, e.g. condensation): 2 patents
 +
* [[:Category:CPC_H01L27/11524|H01L27/11524]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 +
* [[:Category:CPC_H10B41/50|H10B41/50]] (ELECTRONIC MEMORY DEVICES): 2 patents
 +
* [[:Category:CPC_H10B43/50|H10B43/50]] (ELECTRONIC MEMORY DEVICES): 2 patents
 +
* [[:Category:CPC_H01L27/11519|H01L27/11519]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 +
* [[:Category:CPC_H01L21/2254|H01L21/2254]] ({from or through or into an applied layer, e.g. photoresist, nitrides}): 1 patents
 +
* [[:Category:CPC_H01L23/562|H01L23/562]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L21/31053|H01L21/31053]] ({involving a dielectric removal step}): 1 patents
 +
* [[:Category:CPC_H01L21/31144|H01L21/31144]] ({using masks}): 1 patents
 +
* [[:Category:CPC_H01L21/76224|H01L21/76224]] ({using trench refilling with dielectric materials  (trench filling with polycristalline silicon): 1 patents
 +
* [[:Category:CPC_H01L29/40114|H01L29/40114]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L29/42328|H01L29/42328]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L29/42344|H01L29/42344]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L21/76895|H01L21/76895]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
 +
* [[:Category:CPC_H01L21/76805|H01L21/76805]] ({the opening being a via or contact hole penetrating the underlying conductor}): 1 patents
 +
* [[:Category:CPC_H01L21/76829|H01L21/76829]] ({characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers}): 1 patents
 +
* [[:Category:CPC_H01L21/76802|H01L21/76802]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
 +
* [[:Category:CPC_H01L21/76889|H01L21/76889]] ({by deposition over sacrificial masking layer, e.g. lift-off  (lift-off per se): 1 patents
 +
* [[:Category:CPC_H01L27/11553|H01L27/11553]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_G11C5/025|G11C5/025]] ({Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device  (geometrical lay-out of the components in integrated circuits,): 1 patents
 +
* [[:Category:CPC_H01L21/768|H01L21/768]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
 
* [[:Category:CPC_H01L21/31111|H01L21/31111]] ({by chemical means}): 1 patents
 
* [[:Category:CPC_H01L21/31111|H01L21/31111]] ({by chemical means}): 1 patents
* [[:Category:CPC_H01L21/02636|H01L21/02636]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L21/31155|H01L21/31155]] (Doping the insulating layers): 1 patents
* [[:Category:CPC_H01L21/0217|H01L21/0217]] ({the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz  (): 1 patents
+
* [[:Category:CPC_H01L21/32134|H01L21/32134]] ({by liquid etching only}): 1 patents
* [[:Category:CPC_H01L21/02164|H01L21/02164]] ({the material being a silicon oxide, e.g. SiO): 1 patents
+
* [[:Category:CPC_H01L21/32155|H01L21/32155]] (Doping the layers): 1 patents
* [[:Category:CPC_H01L21/02129|H01L21/02129]] ({the material being boron or phosphorus doped silicon oxides, e.g. BPSG, BSG or PSG}): 1 patents
+
* [[:Category:CPC_H01L23/5283|H01L23/5283]] ({Geometry or} layout of the interconnection structure {(): 1 patents
* [[:Category:CPC_H01L29/40117|H01L29/40117]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L21/30608|H01L21/30608]] ({Anisotropic liquid etching  (): 1 patents
* [[:Category:CPC_H01L29/40114|H01L29/40114]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L21/3086|H01L21/3086]] ({characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment}): 1 patents
* [[:Category:CPC_H01L23/53257|H01L23/53257]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L27/11578|H01L27/11578]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L27/11543|H01L27/11543]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  
 
=== Companies ===
 
=== Companies ===
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==== List of Companies ====
 
==== List of Companies ====
* Lodestar Licensing Group LLC: 5 patents
+
* Micron Technology, Inc.: 25 patents
  
 
=== Collaborators ===
 
=== Collaborators ===
* [[:Category:Lifang Xu of Boise ID (US)|Lifang Xu of Boise ID (US)]][[Category:Lifang Xu of Boise ID (US)]] (3 collaborations)
+
* [[:Category:Alyssa N. Scarbrough of Boise ID (US)|Alyssa N. Scarbrough of Boise ID (US)]][[Category:Alyssa N. Scarbrough of Boise ID (US)]] (11 collaborations)
* [[:Category:Jordan D. Greenlee of Boise ID (US)|Jordan D. Greenlee of Boise ID (US)]][[Category:Jordan D. Greenlee of Boise ID (US)]] (2 collaborations)
+
* [[:Category:Jordan D. Greenlee of Boise ID (US)|Jordan D. Greenlee of Boise ID (US)]][[Category:Jordan D. Greenlee of Boise ID (US)]] (10 collaborations)
* [[:Category:Justin Dorhout of Boise ID (US)|Justin Dorhout of Boise ID (US)]][[Category:Justin Dorhout of Boise ID (US)]] (1 collaborations)
+
* [[:Category:Darwin A. Clampitt of Wilder ID (US)|Darwin A. Clampitt of Wilder ID (US)]][[Category:Darwin A. Clampitt of Wilder ID (US)]] (3 collaborations)
* [[:Category:Nirup Bandaru of Boise ID (US)|Nirup Bandaru of Boise ID (US)]][[Category:Nirup Bandaru of Boise ID (US)]] (1 collaborations)
+
* [[:Category:Nancy M. Lomeli of Boise ID (US)|Nancy M. Lomeli of Boise ID (US)]][[Category:Nancy M. Lomeli of Boise ID (US)]] (3 collaborations)
* [[:Category:Damir Fazil of Boise ID (US)|Damir Fazil of Boise ID (US)]][[Category:Damir Fazil of Boise ID (US)]] (1 collaborations)
+
* [[:Category:Shuangqiang Luo of Boise ID (US)|Shuangqiang Luo of Boise ID (US)]][[Category:Shuangqiang Luo of Boise ID (US)]] (2 collaborations)
* [[:Category:Nancy M. Lomeli of Boise ID (US)|Nancy M. Lomeli of Boise ID (US)]][[Category:Nancy M. Lomeli of Boise ID (US)]] (1 collaborations)
+
* [[:Category:Matthew J. King of Boise ID (US)|Matthew J. King of Boise ID (US)]][[Category:Matthew J. King of Boise ID (US)]] (1 collaborations)
* [[:Category:Jivaan Kishore Jhothiraman of Meridian ID (US)|Jivaan Kishore Jhothiraman of Meridian ID (US)]][[Category:Jivaan Kishore Jhothiraman of Meridian ID (US)]] (1 collaborations)
 
* [[:Category:Purnima Narayanan of Boise ID (US)|Purnima Narayanan of Boise ID (US)]][[Category:Purnima Narayanan of Boise ID (US)]] (1 collaborations)
 
 
* [[:Category:Roger W. Lindsay of Boise ID (US)|Roger W. Lindsay of Boise ID (US)]][[Category:Roger W. Lindsay of Boise ID (US)]] (1 collaborations)
 
* [[:Category:Roger W. Lindsay of Boise ID (US)|Roger W. Lindsay of Boise ID (US)]][[Category:Roger W. Lindsay of Boise ID (US)]] (1 collaborations)
* [[:Category:Shuangqiang Luo of Boise ID (US)|Shuangqiang Luo of Boise ID (US)]][[Category:Shuangqiang Luo of Boise ID (US)]] (1 collaborations)
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* [[:Category:Kevin Y. Titus of Meridian ID (US)|Kevin Y. Titus of Meridian ID (US)]][[Category:Kevin Y. Titus of Meridian ID (US)]] (1 collaborations)
* [[:Category:Rita J. Klein of Boise ID (US)|Rita J. Klein of Boise ID (US)]][[Category:Rita J. Klein of Boise ID (US)]] (1 collaborations)
+
* [[:Category:Rohit Kothari of Boise ID (US)|Rohit Kothari of Boise ID (US)]][[Category:Rohit Kothari of Boise ID (US)]] (1 collaborations)
* [[:Category:Everett A. McTeer of Eagle ID (US)|Everett A. McTeer of Eagle ID (US)]][[Category:Everett A. McTeer of Eagle ID (US)]] (1 collaborations)
+
* [[:Category:Adam L. Olson of Boise ID (US)|Adam L. Olson of Boise ID (US)]][[Category:Adam L. Olson of Boise ID (US)]] (1 collaborations)
* [[:Category:Daniel Billingsley of Meridian ID (US)|Daniel Billingsley of Meridian ID (US)]][[Category:Daniel Billingsley of Meridian ID (US)]] (1 collaborations)
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* [[:Category:Jeslin J. Wu of Boise ID (US)|Jeslin J. Wu of Boise ID (US)]][[Category:Jeslin J. Wu of Boise ID (US)]] (1 collaborations)
* [[:Category:Collin Howder of Boise ID (US)|Collin Howder of Boise ID (US)]][[Category:Collin Howder of Boise ID (US)]] (1 collaborations)
+
* [[:Category:Sidhartha Gupta of Boise ID (US)|Sidhartha Gupta of Boise ID (US)]][[Category:Sidhartha Gupta of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Adam W. Saxler of Boise ID (US)|Adam W. Saxler of Boise ID (US)]][[Category:Adam W. Saxler of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Andrew Li of Boise ID (US)|Andrew Li of Boise ID (US)]][[Category:Andrew Li of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Andrew L. Li of Boise ID (US)|Andrew L. Li of Boise ID (US)]][[Category:Andrew L. Li of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Michael J. Puett of Boise ID (US)|Michael J. Puett of Boise ID (US)]][[Category:Michael J. Puett of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Christopher R. Ritchie of Boise ID (US)|Christopher R. Ritchie of Boise ID (US)]][[Category:Christopher R. Ritchie of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Lifang Xu of Boise ID (US)|Lifang Xu of Boise ID (US)]][[Category:Lifang Xu of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Indra V. Chary of Boise ID (US)|Indra V. Chary of Boise ID (US)]][[Category:Indra V. Chary of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Kar Wui Thong of Boise ID (US)|Kar Wui Thong of Boise ID (US)]][[Category:Kar Wui Thong of Boise ID (US)]] (1 collaborations)
 +
* [[:Category:Shicong Wang of Meridain ID (US)|Shicong Wang of Meridain ID (US)]][[Category:Shicong Wang of Meridain ID (US)]] (1 collaborations)
  
 
[[Category:John D. Hopkins of Meridian ID (US)]]
 
[[Category:John D. Hopkins of Meridian ID (US)]]
 
[[Category:Inventors]]
 
[[Category:Inventors]]
[[Category:Inventors filing patents with Lodestar Licensing Group LLC]]
+
[[Category:Inventors filing patents with Micron Technology, Inc.]]

Latest revision as of 03:23, 26 July 2024

John D. Hopkins of Meridian ID (US)

Executive Summary

John D. Hopkins of Meridian ID (US) is an inventor who has filed 25 patents. Their primary areas of innovation include ELECTRONIC MEMORY DEVICES (14 patents), ELECTRONIC MEMORY DEVICES (14 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (9 patents), and they have worked with companies such as Micron Technology, Inc. (25 patents). Their most frequent collaborators include (11 collaborations), (10 collaborations), (3 collaborations).

Patent Filing Activity

John D. Hopkins of Meridian ID (US) Monthly Patent Applications.png

Technology Areas

John D. Hopkins of Meridian ID (US) Top Technology Areas.png

List of Technology Areas

  • H10B43/27 (ELECTRONIC MEMORY DEVICES): 14 patents
  • H10B41/27 (ELECTRONIC MEMORY DEVICES): 14 patents
  • H01L27/11582 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 9 patents
  • H10B43/35 (ELECTRONIC MEMORY DEVICES): 5 patents
  • H01L27/11556 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 5 patents
  • H10B41/35 (ELECTRONIC MEMORY DEVICES): 4 patents
  • H10B41/10 (ELECTRONIC MEMORY DEVICES): 4 patents
  • H10B43/10 (ELECTRONIC MEMORY DEVICES): 4 patents
  • H01L23/5226 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H10B41/41 (ELECTRONIC MEMORY DEVICES): 3 patents
  • H10B43/40 (ELECTRONIC MEMORY DEVICES): 3 patents
  • G11C16/0483 ({comprising cells having several storage transistors connected in series}): 3 patents
  • H01L23/535 (including internal interconnections, e.g. cross-under constructions {(internal lead connections): 3 patents
  • H01L27/11565 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H01L27/1157 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • G11C5/06 (STATIC STORES (semiconductor memory devices): 2 patents
  • H01L29/40117 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L21/28518 (from a gas or vapour, e.g. condensation): 2 patents
  • H01L27/11524 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H10B41/50 (ELECTRONIC MEMORY DEVICES): 2 patents
  • H10B43/50 (ELECTRONIC MEMORY DEVICES): 2 patents
  • H01L27/11519 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L21/2254 ({from or through or into an applied layer, e.g. photoresist, nitrides}): 1 patents
  • H01L23/562 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/31053 ({involving a dielectric removal step}): 1 patents
  • H01L21/31144 ({using masks}): 1 patents
  • H01L21/76224 ({using trench refilling with dielectric materials (trench filling with polycristalline silicon): 1 patents
  • H01L29/40114 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L29/42328 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L29/42344 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/76895 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/76805 ({the opening being a via or contact hole penetrating the underlying conductor}): 1 patents
  • H01L21/76829 ({characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers}): 1 patents
  • H01L21/76802 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/76889 ({by deposition over sacrificial masking layer, e.g. lift-off (lift-off per se): 1 patents
  • H01L27/11553 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • G11C5/025 ({Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device (geometrical lay-out of the components in integrated circuits,): 1 patents
  • H01L21/768 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/31111 ({by chemical means}): 1 patents
  • H01L21/31155 (Doping the insulating layers): 1 patents
  • H01L21/32134 ({by liquid etching only}): 1 patents
  • H01L21/32155 (Doping the layers): 1 patents
  • H01L23/5283 ({Geometry or} layout of the interconnection structure {(): 1 patents
  • H01L21/30608 ({Anisotropic liquid etching (): 1 patents
  • H01L21/3086 ({characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment}): 1 patents
  • H01L27/11578 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L27/11543 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents

Companies

John D. Hopkins of Meridian ID (US) Top Companies.png

List of Companies

  • Micron Technology, Inc.: 25 patents

Collaborators

Subcategories

This category has the following 3 subcategories, out of 3 total.

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Pages in category "John D. Hopkins of Meridian ID (US)"

The following 32 pages are in this category, out of 32 total.

1

M