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Photogrammetry patent applications on April 20th, 2023: Difference between revisions

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=Patent Applications for Photogrammetry on unknown date=
=Patent Applications for Photogrammetry on April 20th, 2023=


Number of patent applications containing 'Photogrammetry' or its variations: 1
Number of patent applications containing 'Photogrammetry' or its variations: 1


[[20230118227. FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCE simplified abstract (ZHEJIANG UNIVERSITY)]]
[[20230118227. FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCE simplified abstract (ZHEJIANG UNIVERSITY)]]
Organization: ZHEJIANG UNIVERSITY


Inventor(s): Kexin Zhang of Zhejiang  (CN) for ZHEJIANG UNIVERSITY, Yiyong Liang of Zhejiang  (CN) for ZHEJIANG UNIVERSITY, Guozhong Li of Zhejiang  (CN) for ZHEJIANG UNIVERSITY
Inventor(s): Kexin Zhang of Zhejiang  (CN) for ZHEJIANG UNIVERSITY, Yiyong Liang of Zhejiang  (CN) for ZHEJIANG UNIVERSITY, Guozhong Li of Zhejiang  (CN) for ZHEJIANG UNIVERSITY
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[[Category:G01B11/24]][[Category:G01N21/01]]
[[Category:G01B11/24]][[Category:G01N21/01]][[Category:ZHEJIANG UNIVERSITY]]




[[Category:Photogrammetry]][[Category:ZHEJIANG UNIVERSITY]]
[[Category:Photogrammetry]][[Category:ZHEJIANG UNIVERSITY]]

Latest revision as of 18:26, 2 January 2024

Patent Applications for Photogrammetry on April 20th, 2023

Number of patent applications containing 'Photogrammetry' or its variations: 1

20230118227. FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCE simplified abstract (ZHEJIANG UNIVERSITY)

Organization: ZHEJIANG UNIVERSITY

Inventor(s): Kexin Zhang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Yiyong Liang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Guozhong Li of Zhejiang (CN) for ZHEJIANG UNIVERSITY

IPC Code(s): G01B11/24, G01N21/01

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