Difference between revisions of "Category:Chih-Hao WANG"

From WikiPatents
Jump to navigation Jump to search
(Updating Category:Chih-Hao_WANG)
(Updating Category:Chih-Hao_WANG)
 
Line 2: Line 2:
  
 
=== Executive Summary ===
 
=== Executive Summary ===
Chih-Hao WANG is an inventor who has filed 34 patents. Their primary areas of innovation include SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (21 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (19 patents), {using a dummy, i.e. replacement gate in a process wherein at least a part of the final gate is self aligned to the dummy gate} (17 patents), and they have worked with companies such as Taiwan Semiconductor Manufacturing Company, Ltd. (18 patents), TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (16 patents). Their most frequent collaborators include [[Category:Kuo-Cheng CHIANG|Kuo-Cheng CHIANG]] (19 collaborations), [[Category:Lin-Yu HUANG|Lin-Yu HUANG]] (10 collaborations), [[Category:Huan-Chieh SU|Huan-Chieh SU]] (9 collaborations).
+
Chih-Hao WANG is an inventor who has filed 11 patents. Their primary areas of innovation include {using a dummy, i.e. replacement gate in a process wherein at least a part of the final gate is self aligned to the dummy gate} (5 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (4 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (4 patents), and they have worked with companies such as Taiwan Semiconductor Manufacturing Co., Ltd. (7 patents), TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (4 patents). Their most frequent collaborators include [[Category:Kuo-Cheng CHIANG|Kuo-Cheng CHIANG]] (5 collaborations), [[Category:Lung-Kun CHU|Lung-Kun CHU]] (3 collaborations), [[Category:Jia-Ni YU|Jia-Ni YU]] (3 collaborations).
  
 
=== Patent Filing Activity ===
 
=== Patent Filing Activity ===
Line 11: Line 11:
  
 
==== List of Technology Areas ====
 
==== List of Technology Areas ====
* [[:Category:CPC_H01L29/42392|H01L29/42392]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 21 patents
+
* [[:Category:CPC_H01L29/66545|H01L29/66545]] ({using a dummy, i.e. replacement gate in a process wherein at least a part of the final gate is self aligned to the dummy gate}): 5 patents
* [[:Category:CPC_H01L29/0673|H01L29/0673]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 19 patents
+
* [[:Category:CPC_H01L29/78696|H01L29/78696]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
* [[:Category:CPC_H01L29/66545|H01L29/66545]] ({using a dummy, i.e. replacement gate in a process wherein at least a part of the final gate is self aligned to the dummy gate}): 17 patents
+
* [[:Category:CPC_H01L27/0886|H01L27/0886]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
* [[:Category:CPC_H01L29/78696|H01L29/78696]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 16 patents
+
* [[:Category:CPC_H01L29/66795|H01L29/66795]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
* [[:Category:CPC_H01L21/823431|H01L21/823431]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 12 patents
+
* [[:Category:CPC_H01L29/775|H01L29/775]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L29/775|H01L29/775]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 12 patents
+
* [[:Category:CPC_H01L29/66439|H01L29/66439]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L29/66439|H01L29/66439]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 11 patents
+
* [[:Category:CPC_H01L29/42392|H01L29/42392]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L29/0847|H01L29/0847]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 9 patents
+
* [[:Category:CPC_H01L21/823878|H01L21/823878]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
* [[:Category:CPC_H01L21/823418|H01L21/823418]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 8 patents
+
* [[:Category:CPC_H01L29/41791|H01L29/41791]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L21/823412|H01L21/823412]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 7 patents
+
* [[:Category:CPC_H01L29/401|H01L29/401]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
* [[:Category:CPC_H01L21/823481|H01L21/823481]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 7 patents
+
* [[:Category:CPC_H01L21/823431|H01L21/823431]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
* [[:Category:CPC_H01L27/0886|H01L27/0886]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 7 patents
+
* [[:Category:CPC_H01L29/0673|H01L29/0673]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L29/66795|H01L29/66795]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 7 patents
+
* [[:Category:CPC_H01L21/823871|H01L21/823871]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
* [[:Category:CPC_H01L29/41791|H01L29/41791]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 6 patents
+
* [[:Category:CPC_H01L23/5226|H01L23/5226]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L29/401|H01L29/401]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 5 patents
+
* [[:Category:CPC_H01L29/0665|H01L29/0665]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L29/0649|H01L29/0649]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 5 patents
+
* [[:Category:CPC_H01L29/785|H01L29/785]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L29/66742|H01L29/66742]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 5 patents
+
* [[:Category:CPC_H01L21/0228|H01L21/0228]] ({deposition by cyclic CVD, e.g. ALD, ALE, pulsed CVD}): 2 patents
* [[:Category:CPC_H01L29/66553|H01L29/66553]] ({using self aligned silicidation, i.e. salicide  (formation of conductive layers comprising silicides): 4 patents
+
* [[:Category:CPC_H01L21/31111|H01L21/31111]] ({by chemical means}): 2 patents
* [[:Category:CPC_H01L21/823475|H01L21/823475]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 4 patents
+
* [[:Category:CPC_H01L27/0924|H01L27/0924]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L29/785|H01L29/785]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
+
* [[:Category:CPC_H01L29/0847|H01L29/0847]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L29/6653|H01L29/6653]] ({using self aligned silicidation, i.e. salicide  (formation of conductive layers comprising silicides): 4 patents
 
* [[:Category:CPC_H01L21/823807|H01L21/823807]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
 
* [[:Category:CPC_H01L21/823814|H01L21/823814]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
 
* [[:Category:CPC_H01L27/092|H01L27/092]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
 
* [[:Category:CPC_H01L27/088|H01L27/088]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
 
* [[:Category:CPC_H01L21/02603|H01L21/02603]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
 
* [[:Category:CPC_H01L21/823437|H01L21/823437]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
 
* [[:Category:CPC_H01L23/5226|H01L23/5226]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
 
* [[:Category:CPC_H01L29/6656|H01L29/6656]] ({using self aligned silicidation, i.e. salicide  (formation of conductive layers comprising silicides): 3 patents
 
* [[:Category:CPC_H01L21/76224|H01L21/76224]] ({using trench refilling with dielectric materials  (trench filling with polycristalline silicon): 3 patents
 
* [[:Category:CPC_H01L21/28088|H01L21/28088]] (Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups): 2 patents
 
* [[:Category:CPC_H01L21/823878|H01L21/823878]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
 
* [[:Category:CPC_H01L21/823828|H01L21/823828]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
 
* [[:Category:CPC_H01L21/764|H01L21/764]] (Making of isolation regions between components): 2 patents
 
* [[:Category:CPC_H01L23/5283|H01L23/5283]] ({Geometry or} layout of the interconnection structure {(): 2 patents
 
* [[:Category:CPC_H01L29/78618|H01L29/78618]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 
* [[:Category:CPC_H01L29/7853|H01L29/7853]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 
* [[:Category:CPC_H01L29/7848|H01L29/7848]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 
 
* [[:Category:CPC_H01L29/7851|H01L29/7851]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
 
* [[:Category:CPC_H01L29/7851|H01L29/7851]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L21/823468|H01L21/823468]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
+
* [[:Category:CPC_H01L29/66636|H01L29/66636]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
* [[:Category:CPC_H01L21/32139|H01L21/32139]] ({using masks}): 2 patents
+
* [[:Category:CPC_H01L21/76224|H01L21/76224]] ({using trench refilling with dielectric materials  (trench filling with polycristalline silicon): 2 patents
* [[:Category:CPC_H01L21/76843|H01L21/76843]] ({formed in openings in a dielectric}): 2 patents
+
* [[:Category:CPC_H01L21/823418|H01L21/823418]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
* [[:Category:CPC_H01L21/31105|H01L21/31105]] ({Etching inorganic layers}): 2 patents
+
* [[:Category:CPC_H01L27/092|H01L27/092]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
* [[:Category:CPC_H01L21/823842|H01L21/823842]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
+
* [[:Category:CPC_H01L21/823807|H01L21/823807]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
* [[:Category:CPC_H01L29/4908|H01L29/4908]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L21/76232|H01L21/76232]] (Dielectric regions {, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers}): 1 patents
 +
* [[:Category:CPC_H01L21/764|H01L21/764]] (Making of isolation regions between components): 1 patents
 +
* [[:Category:CPC_H01L21/7682|H01L21/7682]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
 +
* [[:Category:CPC_H01L21/76843|H01L21/76843]] ({formed in openings in a dielectric}): 1 patents
 +
* [[:Category:CPC_H01L21/823821|H01L21/823821]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 +
* [[:Category:CPC_H01L27/0883|H01L27/0883]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L21/823412|H01L21/823412]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 +
* [[:Category:CPC_H01L21/823462|H01L21/823462]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 +
* [[:Category:CPC_H01L29/0649|H01L29/0649]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L2029/7858|H01L2029/7858]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L29/41725|H01L29/41725]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L21/76802|H01L21/76802]] (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
 +
* [[:Category:CPC_H01L21/76877|H01L21/76877]] ({Thin films associated with contacts of capacitors}): 1 patents
 +
* [[:Category:CPC_H01L21/28556|H01L21/28556]] (from a gas or vapour, e.g. condensation): 1 patents
 +
* [[:Category:CPC_H01L21/32137|H01L21/32137]] ({of silicon-containing layers}): 1 patents
 +
* [[:Category:CPC_H01L21/76898|H01L21/76898]] ({formed through a semiconductor substrate}): 1 patents
 +
* [[:Category:CPC_H01L23/481|H01L23/481]] (Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements {; Selection of materials therefor}): 1 patents
 
* [[:Category:CPC_H01L29/41733|H01L29/41733]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/41733|H01L29/41733]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
* [[:Category:CPC_H01L21/823857|H01L21/823857]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
+
* [[:Category:CPC_H01L29/66742|H01L29/66742]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
* [[:Category:CPC_H01L21/28123|H01L21/28123]] ({Lithography-related aspects, e.g. sub-lithography lengths; Isolation-related aspects, e.g. to solve problems arising at the crossing with the side of the device isolation; Planarisation aspects}): 1 patents
+
* [[:Category:CPC_H01L21/76871|H01L21/76871]] ({Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers}): 1 patents
* [[:Category:CPC_H01L21/76829|H01L21/76829]] ({characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers}): 1 patents
+
* [[:Category:CPC_H01L29/6656|H01L29/6656]] ({using self aligned silicidation, i.e. salicide  (formation of conductive layers comprising silicides): 1 patents
 +
* [[:Category:CPC_H01L29/517|H01L29/517]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L21/31116|H01L21/31116]] ({by dry-etching}): 1 patents
 +
* [[:Category:CPC_H01L21/823437|H01L21/823437]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 +
* [[:Category:CPC_H01L21/823481|H01L21/823481]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 +
* [[:Category:CPC_H01L27/0207|H01L27/0207]] ({Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique}): 1 patents
 +
* [[:Category:CPC_H01L29/7848|H01L29/7848]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L21/0217|H01L21/0217]] ({the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz  (): 1 patents
 +
* [[:Category:CPC_H01L21/02271|H01L21/02271]] ({deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition  (): 1 patents
 +
* [[:Category:CPC_H01L21/0274|H01L21/0274]] (Making masks on semiconductor bodies for further photolithographic processing not provided for in group): 1 patents
 +
* [[:Category:CPC_H01L21/0332|H01L21/0332]] (comprising inorganic layers): 1 patents
 +
* [[:Category:CPC_H01L21/31053|H01L21/31053]] ({involving a dielectric removal step}): 1 patents
 +
* [[:Category:CPC_H01L21/32139|H01L21/32139]] ({using masks}): 1 patents
 +
* [[:Category:CPC_H01L29/165|H01L29/165]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 +
* [[:Category:CPC_H01L29/205|H01L29/205]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/76897|H01L21/76897]] ({Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step  (self-aligned silicidation on field effect transistors): 1 patents
 
* [[:Category:CPC_H01L21/76897|H01L21/76897]] ({Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step  (self-aligned silicidation on field effect transistors): 1 patents
* [[:Category:CPC_H01L21/823456|H01L21/823456]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
+
* [[:Category:CPC_H01L21/823468|H01L21/823468]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
* [[:Category:CPC_H01L29/0653|H01L29/0653]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L21/823475|H01L21/823475]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
* [[:Category:CPC_H01L27/0922|H01L27/0922]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
+
* [[:Category:CPC_H01L23/5283|H01L23/5283]] ({Geometry or} layout of the interconnection structure {(): 1 patents
 +
* [[:Category:CPC_H01L23/5286|H01L23/5286]] ({Geometry or} layout of the interconnection structure {(): 1 patents
 +
* [[:Category:CPC_H01L29/4175|H01L29/4175]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/6681|H01L29/6681]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/6681|H01L29/6681]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
* [[:Category:CPC_H01L29/45|H01L29/45]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/02532|H01L21/02532]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/32134|H01L21/32134]] ({by liquid etching only}): 1 patents
 
* [[:Category:CPC_H01L29/66636|H01L29/66636]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/02164|H01L21/02164]] ({the material being a silicon oxide, e.g. SiO): 1 patents
 
* [[:Category:CPC_H01L21/31116|H01L21/31116]] ({by dry-etching}): 1 patents
 
* [[:Category:CPC_H01L21/28562|H01L21/28562]] (from a gas or vapour, e.g. condensation): 1 patents
 
* [[:Category:CPC_H01L21/76816|H01L21/76816]] ({Aspects relating to the layout of the pattern or to the size of vias or trenches  (layout of the interconnections per se): 1 patents
 
* [[:Category:CPC_H01L21/76852|H01L21/76852]] ({the layer also covering the sidewalls of the conductive structure}): 1 patents
 
* [[:Category:CPC_H01L21/76879|H01L21/76879]] ({by selective deposition of conductive material in the vias, e.g. selective C.V.D. on semiconductor material, plating  (plating on semiconductors in general): 1 patents
 
* [[:Category:CPC_H01L29/0665|H01L29/0665]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/28575|H01L21/28575]] (from a gas or vapour, e.g. condensation): 1 patents
 
* [[:Category:CPC_H01L21/30604|H01L21/30604]] (Chemical or electrical treatment, e.g. electrolytic etching  (to form insulating layers): 1 patents
 
* [[:Category:CPC_H01L27/0928|H01L27/0928]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/823892|H01L21/823892]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 
* [[:Category:CPC_H01L23/481|H01L23/481]] (Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements {; Selection of materials therefor}): 1 patents
 
* [[:Category:CPC_H01L21/76898|H01L21/76898]] ({formed through a semiconductor substrate}): 1 patents
 
* [[:Category:CPC_H01L27/1108|H01L27/1108]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L27/1104|H01L27/1104]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/32137|H01L21/32137]] ({of silicon-containing layers}): 1 patents
 
* [[:Category:CPC_H01L27/11|H01L27/11]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/7854|H01L29/7854]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/66787|H01L29/66787]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/0642|H01L29/0642]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_B82Y40/00|B82Y40/00]] (Manufacture or treatment of nanostructures): 1 patents
 
* [[:Category:CPC_H01L29/42376|H01L29/42376]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/7856|H01L29/7856]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L27/1207|H01L27/1207]] ({combined with devices in contact with the semiconductor body, i.e. bulk/SOI hybrid circuits}): 1 patents
 
* [[:Category:CPC_H01L21/8221|H01L21/8221]] ({Three dimensional integrated circuits stacked in different levels}): 1 patents
 
* [[:Category:CPC_H01L27/0924|H01L27/0924]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/4966|H01L29/4966]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L29/517|H01L29/517]] (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
 
* [[:Category:CPC_H01L21/3086|H01L21/3086]] ({characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment}): 1 patents
 
* [[:Category:CPC_H01L21/823864|H01L21/823864]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 
* [[:Category:CPC_H01L21/823821|H01L21/823821]] (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
 
  
 
=== Companies ===
 
=== Companies ===
Line 105: Line 84:
  
 
==== List of Companies ====
 
==== List of Companies ====
* Taiwan Semiconductor Manufacturing Company, Ltd.: 18 patents
+
* Taiwan Semiconductor Manufacturing Co., Ltd.: 7 patents
* TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.: 16 patents
+
* TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.: 4 patents
  
 
=== Collaborators ===
 
=== Collaborators ===
* [[:Category:Kuo-Cheng CHIANG|Kuo-Cheng CHIANG]][[Category:Kuo-Cheng CHIANG]] (19 collaborations)
+
* [[:Category:Kuo-Cheng CHIANG|Kuo-Cheng CHIANG]][[Category:Kuo-Cheng CHIANG]] (5 collaborations)
* [[:Category:Lin-Yu HUANG|Lin-Yu HUANG]][[Category:Lin-Yu HUANG]] (10 collaborations)
+
* [[:Category:Lung-Kun CHU|Lung-Kun CHU]][[Category:Lung-Kun CHU]] (3 collaborations)
* [[:Category:Huan-Chieh SU|Huan-Chieh SU]][[Category:Huan-Chieh SU]] (9 collaborations)
 
* [[:Category:Shi-Ning JU|Shi-Ning JU]][[Category:Shi-Ning JU]] (8 collaborations)
 
* [[:Category:Kuan-Lun CHENG|Kuan-Lun CHENG]][[Category:Kuan-Lun CHENG]] (8 collaborations)
 
* [[:Category:Guan-Lin CHEN|Guan-Lin CHEN]][[Category:Guan-Lin CHEN]] (6 collaborations)
 
* [[:Category:Shi Ning JU|Shi Ning JU]][[Category:Shi Ning JU]] (6 collaborations)
 
* [[:Category:Kuan-Ting PAN|Kuan-Ting PAN]][[Category:Kuan-Ting PAN]] (5 collaborations)
 
* [[:Category:Chun-Yuan CHEN|Chun-Yuan CHEN]][[Category:Chun-Yuan CHEN]] (4 collaborations)
 
* [[:Category:Jung-Chien CHENG|Jung-Chien CHENG]][[Category:Jung-Chien CHENG]] (4 collaborations)
 
* [[:Category:Li-Zhen YU|Li-Zhen YU]][[Category:Li-Zhen YU]] (4 collaborations)
 
* [[:Category:Lo-Heng CHANG|Lo-Heng CHANG]][[Category:Lo-Heng CHANG]] (4 collaborations)
 
 
* [[:Category:Jia-Ni YU|Jia-Ni YU]][[Category:Jia-Ni YU]] (3 collaborations)
 
* [[:Category:Jia-Ni YU|Jia-Ni YU]][[Category:Jia-Ni YU]] (3 collaborations)
 
* [[:Category:Mao-Lin HUANG|Mao-Lin HUANG]][[Category:Mao-Lin HUANG]] (3 collaborations)
 
* [[:Category:Mao-Lin HUANG|Mao-Lin HUANG]][[Category:Mao-Lin HUANG]] (3 collaborations)
* [[:Category:Lung-Kun CHU|Lung-Kun CHU]][[Category:Lung-Kun CHU]] (3 collaborations)
+
* [[:Category:Kuan-Lun CHENG|Kuan-Lun CHENG]][[Category:Kuan-Lun CHENG]] (3 collaborations)
* [[:Category:Chung-Wei HSU|Chung-Wei HSU]][[Category:Chung-Wei HSU]] (3 collaborations)
+
* [[:Category:Chun-Fu LU|Chun-Fu LU]][[Category:Chun-Fu LU]] (2 collaborations)
* [[:Category:Chun-Fu LU|Chun-Fu LU]][[Category:Chun-Fu LU]] (3 collaborations)
+
* [[:Category:Chung-Wei HSU|Chung-Wei HSU]][[Category:Chung-Wei HSU]] (2 collaborations)
* [[:Category:Jia-Chuan YOU|Jia-Chuan YOU]][[Category:Jia-Chuan YOU]] (3 collaborations)
+
* [[:Category:Kuo-Cheng CHING|Kuo-Cheng CHING]][[Category:Kuo-Cheng CHING]] (2 collaborations)
* [[:Category:Chia-Hao CHANG|Chia-Hao CHANG]][[Category:Chia-Hao CHANG]] (3 collaborations)
 
* [[:Category:Yu-Ming LIN|Yu-Ming LIN]][[Category:Yu-Ming LIN]] (3 collaborations)
 
* [[:Category:Cheng-Chi CHUANG|Cheng-Chi CHUANG]][[Category:Cheng-Chi CHUANG]] (3 collaborations)
 
* [[:Category:Yu-Xuan HUANG|Yu-Xuan HUANG]][[Category:Yu-Xuan HUANG]] (3 collaborations)
 
* [[:Category:Tien-Lu LIN|Tien-Lu LIN]][[Category:Tien-Lu LIN]] (2 collaborations)
 
* [[:Category:Meng-Huan JAO|Meng-Huan JAO]][[Category:Meng-Huan JAO]] (2 collaborations)
 
* [[:Category:Yi-Ruei JHAN|Yi-Ruei JHAN]][[Category:Yi-Ruei JHAN]] (2 collaborations)
 
 
* [[:Category:Ching-Wei TSAI|Ching-Wei TSAI]][[Category:Ching-Wei TSAI]] (2 collaborations)
 
* [[:Category:Ching-Wei TSAI|Ching-Wei TSAI]][[Category:Ching-Wei TSAI]] (2 collaborations)
* [[:Category:Jung-Hung CHANG|Jung-Hung CHANG]][[Category:Jung-Hung CHANG]] (2 collaborations)
+
* [[:Category:Chia-Hao CHANG|Chia-Hao CHANG]][[Category:Chia-Hao CHANG]] (2 collaborations)
* [[:Category:Sheng-Tsung WANG|Sheng-Tsung WANG]][[Category:Sheng-Tsung WANG]] (2 collaborations)
+
* [[:Category:Yu-Ming LIN|Yu-Ming LIN]][[Category:Yu-Ming LIN]] (2 collaborations)
* [[:Category:Wang-Chun HUANG|Wang-Chun HUANG]][[Category:Wang-Chun HUANG]] (2 collaborations)
+
* [[:Category:Shi Ning JU|Shi Ning JU]][[Category:Shi Ning JU]] (2 collaborations)
* [[:Category:Hou-Yu CHEN|Hou-Yu CHEN]][[Category:Hou-Yu CHEN]] (2 collaborations)
+
* [[:Category:Shih-Cheng CHEN|Shih-Cheng CHEN]][[Category:Shih-Cheng CHEN]] (1 collaborations)
* [[:Category:Bo-Rong LIN|Bo-Rong LIN]][[Category:Bo-Rong LIN]] (2 collaborations)
+
* [[:Category:Chun-Hsiung LIN|Chun-Hsiung LIN]][[Category:Chun-Hsiung LIN]] (1 collaborations)
* [[:Category:Jin CAI|Jin CAI]][[Category:Jin CAI]] (1 collaborations)
+
* [[:Category:Li-Zhen YU|Li-Zhen YU]][[Category:Li-Zhen YU]] (1 collaborations)
 +
* [[:Category:Cheng-Chi CHUANG|Cheng-Chi CHUANG]][[Category:Cheng-Chi CHUANG]] (1 collaborations)
 +
* [[:Category:Chun-Yuan CHEN|Chun-Yuan CHEN]][[Category:Chun-Yuan CHEN]] (1 collaborations)
 +
* [[:Category:Huan-Chieh SU|Huan-Chieh SU]][[Category:Huan-Chieh SU]] (1 collaborations)
 +
* [[:Category:Shang-Wen CHANG|Shang-Wen CHANG]][[Category:Shang-Wen CHANG]] (1 collaborations)
 +
* [[:Category:Yi-Hsun CHIU|Yi-Hsun CHIU]][[Category:Yi-Hsun CHIU]] (1 collaborations)
 
* [[:Category:Shih-Chuan CHIU|Shih-Chuan CHIU]][[Category:Shih-Chuan CHIU]] (1 collaborations)
 
* [[:Category:Shih-Chuan CHIU|Shih-Chuan CHIU]][[Category:Shih-Chuan CHIU]] (1 collaborations)
* [[:Category:Pei-Yu WANG|Pei-Yu WANG]][[Category:Pei-Yu WANG]] (1 collaborations)
+
* [[:Category:Tien-Lu LIN|Tien-Lu LIN]][[Category:Tien-Lu LIN]] (1 collaborations)
* [[:Category:Cheng-Ting CHUNG|Cheng-Ting CHUNG]][[Category:Cheng-Ting CHUNG]] (1 collaborations)
+
* [[:Category:Jia-Chuan YOU|Jia-Chuan YOU]][[Category:Jia-Chuan YOU]] (1 collaborations)
* [[:Category:Min CAO|Min CAO]][[Category:Min CAO]] (1 collaborations)
+
* [[:Category:Kuan-Ting PAN|Kuan-Ting PAN]][[Category:Kuan-Ting PAN]] (1 collaborations)
* [[:Category:Pei-Hsun WANG|Pei-Hsun WANG]][[Category:Pei-Hsun WANG]] (1 collaborations)
+
* [[:Category:Shi-Ning JU|Shi-Ning JU]][[Category:Shi-Ning JU]] (1 collaborations)
* [[:Category:Yun-Ju FAN|Yun-Ju FAN]][[Category:Yun-Ju FAN]] (1 collaborations)
 
* [[:Category:Wei-Ting WANG|Wei-Ting WANG]][[Category:Wei-Ting WANG]] (1 collaborations)
 
* [[:Category:Yi-Bo LIAO|Yi-Bo LIAO]][[Category:Yi-Bo LIAO]] (1 collaborations)
 
* [[:Category:Yi-Hsun CHIU|Yi-Hsun CHIU]][[Category:Yi-Hsun CHIU]] (1 collaborations)
 
* [[:Category:Hsiao-Han LIU|Hsiao-Han LIU]][[Category:Hsiao-Han LIU]] (1 collaborations)
 
* [[:Category:Zhi-Chang LIN|Zhi-Chang LIN]][[Category:Zhi-Chang LIN]] (1 collaborations)
 
* [[:Category:Shih-Cheng CHEN|Shih-Cheng CHEN]][[Category:Shih-Cheng CHEN]] (1 collaborations)
 
* [[:Category:Chien Ning YAO|Chien Ning YAO]][[Category:Chien Ning YAO]] (1 collaborations)
 
* [[:Category:Kuo-Cheng CHING|Kuo-Cheng CHING]][[Category:Kuo-Cheng CHING]] (1 collaborations)
 
  
 
[[Category:Chih-Hao WANG]]
 
[[Category:Chih-Hao WANG]]
 
[[Category:Inventors]]
 
[[Category:Inventors]]
[[Category:Inventors filing patents with Taiwan Semiconductor Manufacturing Company, Ltd.]]
+
[[Category:Inventors filing patents with Taiwan Semiconductor Manufacturing Co., Ltd.]]
[[Category:Inventors filing patents with TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.]]
+
[[Category:Inventors filing patents with TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.]]

Latest revision as of 02:14, 19 July 2024

Chih-Hao WANG

Executive Summary

Chih-Hao WANG is an inventor who has filed 11 patents. Their primary areas of innovation include {using a dummy, i.e. replacement gate in a process wherein at least a part of the final gate is self aligned to the dummy gate} (5 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (4 patents), SEMICONDUCTOR DEVICES NOT COVERED BY CLASS (4 patents), and they have worked with companies such as Taiwan Semiconductor Manufacturing Co., Ltd. (7 patents), TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (4 patents). Their most frequent collaborators include (5 collaborations), (3 collaborations), (3 collaborations).

Patent Filing Activity

Chih-Hao WANG Monthly Patent Applications.png

Technology Areas

Chih-Hao WANG Top Technology Areas.png

List of Technology Areas

  • H01L29/66545 ({using a dummy, i.e. replacement gate in a process wherein at least a part of the final gate is self aligned to the dummy gate}): 5 patents
  • H01L29/78696 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
  • H01L27/0886 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
  • H01L29/66795 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 4 patents
  • H01L29/775 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H01L29/66439 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H01L29/42392 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H01L21/823878 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
  • H01L29/41791 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H01L29/401 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 3 patents
  • H01L21/823431 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 3 patents
  • H01L29/0673 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L21/823871 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
  • H01L23/5226 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L29/0665 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L29/785 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L21/0228 ({deposition by cyclic CVD, e.g. ALD, ALE, pulsed CVD}): 2 patents
  • H01L21/31111 ({by chemical means}): 2 patents
  • H01L27/0924 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L29/0847 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L29/7851 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L29/66636 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 2 patents
  • H01L21/76224 ({using trench refilling with dielectric materials (trench filling with polycristalline silicon): 2 patents
  • H01L21/823418 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 2 patents
  • H01L27/092 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/823807 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L21/76232 (Dielectric regions {, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers}): 1 patents
  • H01L21/764 (Making of isolation regions between components): 1 patents
  • H01L21/7682 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/76843 ({formed in openings in a dielectric}): 1 patents
  • H01L21/823821 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L27/0883 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/823412 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L21/823462 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L29/0649 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L2029/7858 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L29/41725 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/76802 (Applying interconnections to be used for carrying current between separate components within a device {comprising conductors and dielectrics}): 1 patents
  • H01L21/76877 ({Thin films associated with contacts of capacitors}): 1 patents
  • H01L21/28556 (from a gas or vapour, e.g. condensation): 1 patents
  • H01L21/32137 ({of silicon-containing layers}): 1 patents
  • H01L21/76898 ({formed through a semiconductor substrate}): 1 patents
  • H01L23/481 (Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements {; Selection of materials therefor}): 1 patents
  • H01L29/41733 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L29/66742 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/76871 ({Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers}): 1 patents
  • H01L29/6656 ({using self aligned silicidation, i.e. salicide (formation of conductive layers comprising silicides): 1 patents
  • H01L29/517 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/31116 ({by dry-etching}): 1 patents
  • H01L21/823437 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L21/823481 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L27/0207 ({Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique}): 1 patents
  • H01L29/7848 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/0217 ({the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz (): 1 patents
  • H01L21/02271 ({deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition (): 1 patents
  • H01L21/0274 (Making masks on semiconductor bodies for further photolithographic processing not provided for in group): 1 patents
  • H01L21/0332 (comprising inorganic layers): 1 patents
  • H01L21/31053 ({involving a dielectric removal step}): 1 patents
  • H01L21/32139 ({using masks}): 1 patents
  • H01L29/165 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L29/205 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L21/76897 ({Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step (self-aligned silicidation on field effect transistors): 1 patents
  • H01L21/823468 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L21/823475 (to produce devices, e.g. integrated circuits, each consisting of a plurality of components): 1 patents
  • H01L23/5283 ({Geometry or} layout of the interconnection structure {(): 1 patents
  • H01L23/5286 ({Geometry or} layout of the interconnection structure {(): 1 patents
  • H01L29/4175 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents
  • H01L29/6681 (SEMICONDUCTOR DEVICES NOT COVERED BY CLASS): 1 patents

Companies

Chih-Hao WANG Top Companies.png

List of Companies

  • Taiwan Semiconductor Manufacturing Co., Ltd.: 7 patents
  • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.: 4 patents

Collaborators

Subcategories

This category has the following 3 subcategories, out of 3 total.

C

K

L