View source for The boeing company (20240344980). Microspot Reflectometer simplified abstract

=Microspot Reflectometer=


==Organization Name==

[[:Category:the boeing company|the boeing company]]


[[Category:the boeing company]]

==Inventor(s)==

[[:Category:Brian Gunther of St. Louis MO (US)|Brian Gunther of St. Louis MO (US)]][[Category:Brian Gunther of St. Louis MO (US)]]

[[:Category:James Thaddeus Wegner of St. Louis MO (US)|James Thaddeus Wegner of St. Louis MO (US)]][[Category:James Thaddeus Wegner of St. Louis MO (US)]]

[[:Category:Jeffery Thomas Murphy of Troy MO (US)|Jeffery Thomas Murphy of Troy MO (US)]][[Category:Jeffery Thomas Murphy of Troy MO (US)]]

==Microspot Reflectometer - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240344980 titled 'Microspot Reflectometer

==Simplified Explanation==
A reflectometer is designed to test a sample by emitting a light beam onto it. The reflectometer focuses the light beam onto the sample to view its structure/defects using a detector.

* Light source emits a light beam onto the sample
* Sample holder holds the sample in place
* Light beam is focused to a reduced spot size on the sample
* Detector downstream from the sample views the structure/defects

==Key Features and Innovation==
* Reflectometer for testing samples
* Light beam focused to a reduced spot size
* Detector used to view structure/defects in the sample

==Potential Applications==
This technology can be used in various industries such as:
* Material science
* Quality control
* Semiconductor manufacturing

==Problems Solved==
* Allows for non-destructive testing of samples
* Enables the detection of defects in samples

==Benefits==
* Improved quality control
* Faster testing process
* Enhanced accuracy in detecting defects

==Commercial Applications==
===Reflectometer for Sample Testing in Quality Control===
This technology can be utilized in quality control processes across industries, ensuring the efficient and accurate testing of samples.

==Prior Art==
Readers can explore prior art related to reflectometers, sample testing, and defect detection in materials science and quality control industries.

==Frequently Updated Research==
Stay updated on the latest advancements in reflectometer technology, sample testing methods, and defect detection techniques in various industries.

==Questions about Reflectometer Technology==
===What are the key components of a reflectometer?===
A reflectometer typically consists of a light source, sample holder, focused light beam, and a detector for viewing structure/defects.

===How can reflectometer technology benefit different industries?===
Reflectometer technology can improve quality control processes, enhance accuracy in defect detection, and streamline sample testing across various industries.


==Original Abstract Submitted==

a reflectometer configured to test a sample. the reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. the reflectometer focuses the light beam to a reduced spot size on the sample. the reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample.



[[Category:G01N21/55]]
[[Category:G02B26/08]]
[[Category:CPC_G01N21/55]]