View source for Sk hynix inc. (20240264038). PROBE CARD simplified abstract

=PROBE CARD=


==Organization Name==

[[:Category:sk hynix inc.|sk hynix inc.]]


[[Category:sk hynix inc.]]

==Inventor(s)==

[[:Category:Sung Wook Cho of Icheon-si (KR)|Sung Wook Cho of Icheon-si (KR)]][[Category:Sung Wook Cho of Icheon-si (KR)]]

[[:Category:Yeon Su Yeo of Icheon-si (KR)|Yeon Su Yeo of Icheon-si (KR)]][[Category:Yeon Su Yeo of Icheon-si (KR)]]

==PROBE CARD - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240264038 titled 'PROBE CARD

'''Simplified Explanation:'''
The patent application discloses probe cards that can replace lens units in certain applications. These probe cards include a lens unit, a jig for holding the lens unit, and a holder unit for supporting the lens unit.

'''Key Features and Innovation:'''
* Probe cards with integrated lens units for light irradiation.
* Jig for securely holding the lens unit in place.
* Holder unit for providing support to the lens unit.

'''Potential Applications:'''
The technology can be used in semiconductor testing, optical inspection systems, and other applications requiring precise light irradiation.

'''Problems Solved:'''
The technology addresses the need for accurate and controlled light irradiation in various testing and inspection processes.

'''Benefits:'''
* Improved accuracy and precision in light irradiation.
* Simplified setup and operation in testing and inspection systems.
* Enhanced reliability and repeatability of results.

'''Commercial Applications:'''
The technology can be applied in the semiconductor industry, electronics manufacturing, and quality control processes for various industries.

'''Questions about Probe Cards with Integrated Lens Units:'''
1. How does the integration of lens units in probe cards improve testing processes?
2. What are the potential cost savings associated with using probe cards with integrated lens units?

'''Frequently Updated Research:'''
Stay updated on advancements in probe card technology and applications in semiconductor testing and optical inspection systems.


==Original Abstract Submitted==

probe cards that can replace lens units are disclosed. in some implementations, a probe card may include a lens unit through which light irradiated from a light source unit; a jig into which the lens unit is inserted inside, and a holder unit for closely supporting the lens unit.



[[Category:G01M11/02]]
[[Category:G01R1/073]]
[[Category:G01R31/28]]
[[Category:CPC_G01M11/0214]]