View source for Sk hynix inc. (20240118983). METHOD FOR FACILITATING TESTING FOR AN INTERCONNECTION PROTOCOL, A CONTROLLER, AND AN ELECTRONIC DEVICE simplified abstract

=METHOD FOR FACILITATING TESTING FOR AN INTERCONNECTION PROTOCOL, A CONTROLLER, AND AN ELECTRONIC DEVICE=


==Organization Name==

[[:Category:sk hynix inc.|sk hynix inc.]]


[[Category:sk hynix inc.]]

==Inventor(s)==

[[:Category:WEN JYH Lin of Zhubei City Hsinchu County (TW)|WEN JYH Lin of Zhubei City Hsinchu County (TW)]][[Category:WEN JYH Lin of Zhubei City Hsinchu County (TW)]]

==METHOD FOR FACILITATING TESTING FOR AN INTERCONNECTION PROTOCOL, A CONTROLLER, AND AN ELECTRONIC DEVICE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240118983 titled 'METHOD FOR FACILITATING TESTING FOR AN INTERCONNECTION PROTOCOL, A CONTROLLER, AND AN ELECTRONIC DEVICE

==Simplified Explanation==

The abstract describes a method for facilitating testing for an interconnection protocol, a controller, and an electronic device. The method involves entering a test mode with improved data transmission rates, generating a test pattern using advanced line encoding, and transmitting the test data signal through the electronic device to another electronic device.

* Test mode request signal received at controller
* Test data signal generated with test pattern using advanced line encoding
* Test data signal transmitted through electronic device to another electronic device

== Potential Applications ==
This technology could be applied in the testing and development of interconnection protocols for electronic devices, ensuring efficient data transmission rates and accurate testing procedures.

== Problems Solved ==
This technology solves the problem of testing interconnection protocols with improved data rates and advanced line encoding, allowing for more accurate and reliable testing procedures.

== Benefits ==
The benefits of this technology include enhanced testing capabilities, improved data transmission rates, and more efficient testing procedures for electronic devices.

== Potential Commercial Applications ==
One potential commercial application of this technology could be in the telecommunications industry, where testing and development of interconnection protocols are crucial for ensuring reliable communication networks.

== Possible Prior Art ==
One possible prior art for this technology could be existing methods for testing interconnection protocols using traditional encoding techniques, such as 8b/10b encoding.

== Unanswered Questions ==

=== How does this method compare to existing testing procedures for interconnection protocols? ===
This article does not provide a direct comparison to existing testing procedures, leaving the reader to wonder about the specific advantages of this new method.

=== What are the specific technical specifications of the advanced line encoding used in this method? ===
The article does not delve into the technical details of the advanced line encoding, leaving the reader curious about the specific characteristics and performance of this encoding technique.


==Original Abstract Submitted==

method for facilitating testing for an interconnection protocol, a controller, and an electronic device are provided. the method is suitable for an electronic device capable of communicating with another electronic device. the method comprises the following steps. at a controller of the electronic device, a test mode request signal is received to enter a test mode in which data transmission is to be performed by using an advanced line encoding having an improved effective data rate as compared to 8b/10b encoding. at the controller, a test data signal is generated to indicate a test pattern including an ordered set portion and a data pattern portion by using the advanced line encoding. the test data signal is transmitted according to the advanced line encoding through the electronic device to the other electronic device.



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