View source for Samsung electronics co., ltd. (20240338287). SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE simplified abstract

=SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE=


==Organization Name==

[[:Category:samsung electronics co., ltd.|samsung electronics co., ltd.]]


[[Category:samsung electronics co., ltd.]]

==Inventor(s)==

[[:Category:Nageswara Rao Kunchapu of Bengaluru (IN)|Nageswara Rao Kunchapu of Bengaluru (IN)]][[Category:Nageswara Rao Kunchapu of Bengaluru (IN)]]

[[:Category:Praveen S. Bharadwaj of Bengaluru (IN)|Praveen S. Bharadwaj of Bengaluru (IN)]][[Category:Praveen S. Bharadwaj of Bengaluru (IN)]]

[[:Category:Somasunder Kattepura Sreenath of Bengaluru (IN)|Somasunder Kattepura Sreenath of Bengaluru (IN)]][[Category:Somasunder Kattepura Sreenath of Bengaluru (IN)]]

==SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240338287 titled 'SER-DES TEST CHIP AND METHOD FOR MANAGING INTER-OPERABILITY DATA RATE RANGE

The abstract describes a method for managing the inter-operability data rate range of serializer/deserializer (ser-des) test chips, which aims to double the data rate range, reduce skew on data pins, and enhance the performance in the inter-operability test of the ser-des test chip.

* Increases the inter-operability data rate range of ser-des test chips
* Reduces skew on data pins
* Improves performance in inter-operability tests
* Enhances the overall functionality of ser-des test chips
* Provides a method for managing data rate range effectively

Potential Applications:
This technology can be applied in the semiconductor industry for testing and optimizing the performance of ser-des test chips. It can also be used in telecommunications and data communication systems to improve data transmission efficiency.

Problems Solved:
This technology addresses the limitations in data rate range and skew on data pins of ser-des test chips, ultimately enhancing their performance and reliability in inter-operability tests.

Benefits:
- Improved data rate range
- Reduced skew on data pins
- Enhanced performance in inter-operability tests
- Increased reliability of ser-des test chips

Commercial Applications:
This technology can be utilized by semiconductor companies, telecommunications providers, and data communication equipment manufacturers to enhance the performance of ser-des test chips, leading to more efficient data transmission and improved product quality.

Questions about the technology:
1. How does this method improve the performance of ser-des test chips in inter-operability tests?
2. What are the potential implications of doubling the data rate range of ser-des test chips in real-world applications?


==Original Abstract Submitted==

there is provided a method for managing the inter-operability data rate range of serializer/deserializer (ser-des) test chips. the method doubles the inter-operability data rate range of the ser-des test chip, reduces the skew on data pins, and thereby increases the performance in the inter-operability test of the ser-des test chip.



[[Category:G06F11/22]]
[[Category:CPC_G06F11/2221]]