View source for Samsung electronics co., ltd. (20240211755). METHOD OF PROVIDING ARTIFICIAL INTELLIGENCE ALGORITHM, OPERATING METHOD OF ARTIFICIAL INTELLIGENCE ALGORITHM, ELECTRONIC DEVICE, RECORDING MEDIUM, AND COMPUTER PROGRAM simplified abstract

=METHOD OF PROVIDING ARTIFICIAL INTELLIGENCE ALGORITHM, OPERATING METHOD OF ARTIFICIAL INTELLIGENCE ALGORITHM, ELECTRONIC DEVICE, RECORDING MEDIUM, AND COMPUTER PROGRAM=


==Organization Name==

[[:Category:samsung electronics co., ltd.|samsung electronics co., ltd.]]


[[Category:samsung electronics co., ltd.]]

==Inventor(s)==

[[:Category:Sunghee Lee of Suwon-si (KR)|Sunghee Lee of Suwon-si (KR)]][[Category:Sunghee Lee of Suwon-si (KR)]]

[[:Category:QHwan Kim of Suwon-si (KR)|QHwan Kim of Suwon-si (KR)]][[Category:QHwan Kim of Suwon-si (KR)]]

[[:Category:Minkyu Kim of Suwon-si (KR)|Minkyu Kim of Suwon-si (KR)]][[Category:Minkyu Kim of Suwon-si (KR)]]

[[:Category:Bongseok Kim of Suwon-si (KR)|Bongseok Kim of Suwon-si (KR)]][[Category:Bongseok Kim of Suwon-si (KR)]]

[[:Category:Youngseok Kim of Suwon-si (KR)|Youngseok Kim of Suwon-si (KR)]][[Category:Youngseok Kim of Suwon-si (KR)]]

[[:Category:Ami Ma of Suwon-si (KR)|Ami Ma of Suwon-si (KR)]][[Category:Ami Ma of Suwon-si (KR)]]

[[:Category:Jinkook Park of Suwon-si (KR)|Jinkook Park of Suwon-si (KR)]][[Category:Jinkook Park of Suwon-si (KR)]]

[[:Category:Kyubaik Chang of Suwon-si (KR)|Kyubaik Chang of Suwon-si (KR)]][[Category:Kyubaik Chang of Suwon-si (KR)]]

[[:Category:Jaehoon Jeong of Suwon-si (KR)|Jaehoon Jeong of Suwon-si (KR)]][[Category:Jaehoon Jeong of Suwon-si (KR)]]

==METHOD OF PROVIDING ARTIFICIAL INTELLIGENCE ALGORITHM, OPERATING METHOD OF ARTIFICIAL INTELLIGENCE ALGORITHM, ELECTRONIC DEVICE, RECORDING MEDIUM, AND COMPUTER PROGRAM - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240211755 titled 'METHOD OF PROVIDING ARTIFICIAL INTELLIGENCE ALGORITHM, OPERATING METHOD OF ARTIFICIAL INTELLIGENCE ALGORITHM, ELECTRONIC DEVICE, RECORDING MEDIUM, AND COMPUTER PROGRAM

**Simplified Explanation:**
The patent application describes a method for providing an artificial intelligence algorithm that can analyze semiconductor data sets and structures. The algorithm calculates an out of distribution index, splits the data sets, samples them, and selects the optimal AI algorithm for learning the data sets.

**Key Features and Innovation:**
* Loading and analyzing semiconductor data sets and structures.
* Calculating out of distribution indexes for semiconductor spectra.
* Clustering and sampling data sets for learning.
* Selecting the best AI algorithm for analyzing semiconductor data.

**Potential Applications:**
This technology can be applied in semiconductor manufacturing, quality control, and research and development in the electronics industry.

**Problems Solved:**
The technology addresses the need for efficient analysis of semiconductor data sets and structures to improve decision-making processes in the industry.

**Benefits:**
* Enhanced analysis of semiconductor data.
* Improved accuracy in identifying out of distribution data.
* Optimal selection of AI algorithms for learning semiconductor data sets.

**Commercial Applications:**
The technology can be used in semiconductor manufacturing companies, research institutions, and quality control departments to streamline data analysis processes and improve decision-making.

**Prior Art:**
Researchers can explore prior patents related to AI algorithms in semiconductor analysis and data clustering to understand the existing technology landscape.

**Frequently Updated Research:**
Stay updated on the latest advancements in AI algorithms for semiconductor analysis and data clustering to enhance the efficiency and accuracy of the technology.

**Questions about Semiconductor Analysis with AI:**
1. How does this technology improve the analysis of semiconductor data sets compared to traditional methods?
2. What are the potential limitations of using AI algorithms for semiconductor analysis, and how can they be addressed?


==Original Abstract Submitted==

provided are a method of providing an artificial intelligence (ai) algorithm, an operation method of an ai algorithm, an electronic device, a recording medium, and a computer program. the method of providing the ai algorithm includes loading data sets with respect to a spectrum of a semiconductor and a structure of the semiconductor, calculating an out of distribution (ood) index with respect to the spectrum of the semiconductor, performing data split by clustering sampling the data sets into at least one learning data set with respect to ood indexes according to semiconductors, and providing an optimal ai algorithm from among a plurality of ai algorithms that have learned the at least one learning data set.



[[Category:G06N3/08]]
[[Category:CPC_G06N3/08]]