View source for Samsung electronics co., ltd. (20240119997). SEMICONDUCTOR CHIP CAPABLE OF CALIBRATING BIAS VOLTAGE SUPPLIED TO WRITE CLOCK BUFFER REGARDLESS OF PROCESS VARIATION AND TEMPERATURE VARIATION, AND DEVICES INCLUDING THE SAME simplified abstract

=SEMICONDUCTOR CHIP CAPABLE OF CALIBRATING BIAS VOLTAGE SUPPLIED TO WRITE CLOCK BUFFER REGARDLESS OF PROCESS VARIATION AND TEMPERATURE VARIATION, AND DEVICES INCLUDING THE SAME=


==Organization Name==

[[:Category:samsung electronics co., ltd.|samsung electronics co., ltd.]]


[[Category:samsung electronics co., ltd.]]

==Inventor(s)==

[[:Category:GARAM Choi of Suwon-si (KR)|GARAM Choi of Suwon-si (KR)]][[Category:GARAM Choi of Suwon-si (KR)]]

[[:Category:Yonghun Kim of Suwon-si (KR)|Yonghun Kim of Suwon-si (KR)]][[Category:Yonghun Kim of Suwon-si (KR)]]

[[:Category:Jaewoo Lee of Suwon-si (KR)|Jaewoo Lee of Suwon-si (KR)]][[Category:Jaewoo Lee of Suwon-si (KR)]]

[[:Category:Kihan Kim of Suwon-si (KR)|Kihan Kim of Suwon-si (KR)]][[Category:Kihan Kim of Suwon-si (KR)]]

[[:Category:Hojun Chang of Suwon-si (KR)|Hojun Chang of Suwon-si (KR)]][[Category:Hojun Chang of Suwon-si (KR)]]

==SEMICONDUCTOR CHIP CAPABLE OF CALIBRATING BIAS VOLTAGE SUPPLIED TO WRITE CLOCK BUFFER REGARDLESS OF PROCESS VARIATION AND TEMPERATURE VARIATION, AND DEVICES INCLUDING THE SAME - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240119997 titled 'SEMICONDUCTOR CHIP CAPABLE OF CALIBRATING BIAS VOLTAGE SUPPLIED TO WRITE CLOCK BUFFER REGARDLESS OF PROCESS VARIATION AND TEMPERATURE VARIATION, AND DEVICES INCLUDING THE SAME

==Simplified Explanation==

The semiconductor chip described in the patent application includes a write clock buffer, a voltage regulator, a process calibration circuit, and a temperature calibration circuit. The voltage regulator generates multiple regulated voltages, with one of them being output as a bias voltage for the write clock buffer by the process calibration circuit based on the semiconductor chip's process variation. The temperature calibration circuit tracks the chip's temperature variation in real-time, performs analog calibration on the bias voltage from the process calibration circuit based on the tracking result, and outputs the analog-calibrated bias voltage to the write clock buffer.

* The semiconductor chip includes a write clock buffer, voltage regulator, process calibration circuit, and temperature calibration circuit.
* The voltage regulator generates multiple regulated voltages, with one being output as a bias voltage for the write clock buffer by the process calibration circuit based on process variation.
* The temperature calibration circuit tracks temperature variation in real-time, performs analog calibration on the bias voltage from the process calibration circuit based on the tracking result, and outputs the analog-calibrated bias voltage to the write clock buffer.

== Potential Applications ==
This technology could be applied in various semiconductor devices requiring precise voltage regulation and temperature compensation, such as microcontrollers, sensors, and communication devices.

== Problems Solved ==
1. Ensures stable and accurate operation of the write clock buffer despite process variations in the semiconductor chip.
2. Compensates for temperature fluctuations to maintain optimal performance of the chip.

== Benefits ==
1. Improved reliability and performance of semiconductor chips.
2. Real-time calibration enhances overall functionality and efficiency of the chip.

== Potential Commercial Applications ==
Optimized Voltage Regulation and Temperature Compensation Technology for Semiconductor Chips

== Possible Prior Art ==
Prior art may include similar techniques for voltage regulation and temperature compensation in semiconductor devices, but the specific combination of process calibration and real-time analog calibration as described in this patent application may be novel.

=== Unanswered Questions ===

=== How does this technology impact power consumption in semiconductor chips? ===
The article does not delve into the potential effects of this technology on power consumption in semiconductor chips. This aspect could be crucial for assessing the overall efficiency and sustainability of the innovation.

=== What are the potential challenges in implementing this technology on a large scale in semiconductor manufacturing processes? ===
The article does not address the practical challenges that may arise when implementing this technology on a large scale in semiconductor manufacturing. Understanding these challenges could provide insights into the feasibility and scalability of the innovation.


==Original Abstract Submitted==

a semiconductor chip includes a write clock buffer, a voltage regulator, a process calibration circuit and a temperature calibration circuit. the voltage regulator generates plural regulated voltages. the process calibration circuit output one of the regulated voltages as a bias voltage of the write clock buffer, depending on a process variation of the semiconductor chip. the temperature calibration circuit track a temperature variation of the semiconductor chip in real time, performs analog calibration on the bias voltage from the process calibration circuit in real time depending on a result of the tracking, and outputs the analog-calibrated bias voltage to the write clock buffer.



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