View source for SATYIELD INC. (20240420254). A VERSATILE CROP YIELD ESTIMATOR

=A VERSATILE CROP YIELD ESTIMATOR=


==Organization Name==

[[:Category:SATYIELD INC.|SATYIELD INC.]]


[[Category:SATYIELD INC.]]

==Inventor(s)==

[[:Category:Yuval Sadeh of Kibbutz Maayan-Baruch (IL)|Yuval Sadeh of Kibbutz Maayan-Baruch (IL)]][[Category:Yuval Sadeh of Kibbutz Maayan-Baruch (IL)]]

==A VERSATILE CROP YIELD ESTIMATOR==


This abstract first appeared for US patent application 20240420254 titled 'A VERSATILE CROP YIELD ESTIMATOR




==Original Abstract Submitted==

a method for estimating crop yield of an analyzed area, which is a region of interest, according to which imagery data is acquired from one or more remotely sensed sources, using a remote sensing platform or one or more satellites. a remotely sensed lai of the analyzed area is generated by fusing the acquired imagery data and the sowing date of the analyzed field is detected by processing the imagery data. the detected sowing date and a sowing date window are fed into a crop simulator (e.g., apsim) and a set of predetermined parameters representing the state of the analyzed area is then generated, and fed into the crop simulator. the crop simulator generates a plurality of lai simulations, each corresponding to a different combination of parameters. only lai simulations in which the simulated lai best matches the remotely sensed lai are identified and selected, while omitting all other lai simulations. finally, the yield prediction that corresponds to the simulation(s) with the best match, are selected.



[[Category:G06Q50/02]]
[[Category:G06V10/25]]
[[Category:G06V10/80]]
[[Category:G06V20/10]]
[[Category:G06V20/13]]
[[Category:CPC_G06Q50/02]]